1. Evaluation of SRAMs reliability for space electronics using ultrashort laser pulses
- Author
-
Darracq, Frédéric, Lapuyade, Herve, Fouillat, Pascal, Pouget, Vincent, Lewis, Dean, Danto, Yves, Laboratoire de l'intégration, du matériau au système (IMS), Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1, and Darracq, Frédéric
- Subjects
[PHYS.PHYS.PHYS-OPTICS] Physics [physics]/Physics [physics]/Optics [physics.optics] ,SEUs ,[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics] ,Hardware_MEMORYSTRUCTURES ,laser pulse ,SRAMs ,Hardware_PERFORMANCEANDRELIABILITY ,reliabilty ,[SPI.TRON] Engineering Sciences [physics]/Electronics ,[SPI.TRON]Engineering Sciences [physics]/Electronics - Abstract
International audience; This paper proposes a complete method dedicated to the evaluation of SRAMs sensitivity to single event upsets using ultrashort laser pulses.
- Published
- 2006