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CuInSe 2 (CIS) layers were grown by co-evaporation in a molecular beam epitaxy system onto soda lime glass substrates by using both two-step and three step processes. The physical properties of the layers were investigated using X-ray diffraction (XRD) and optical spectroscopy. The sample atomic composition was assessed by energy dispersive analysis of X-rays. Cu-rich or In-rich CIS thin films were obtained exhibiting strong preferential (112) and (220)/(204) orientations in both cases. We performed thermal annealing at 450 °C under nitrogen, keeping Se overpressure to avoid Se desorption from the layer. The annealed layers all exhibit improved crystalline quality, with reduced stoichiometric discrepancy. The secondary phases like Cu x Se 1 − x or In x Se 1 − x are no more observable by XRD measurements. Regarding the preferential orientation, thermal annealing of Cu-rich CIS layers favours the (112) orientation leading to a more (112) textured layer after annealing, whatever the initial preferential growth orientation was. In opposite, thermal annealing of In-rich samples increases the (220)/(204) texture of the sample.

International audience; Light scattering spectroscopy, mainly developed for Cu(In,Ga)Se2 thin films growth, has been demonstrated to be an efficient in-situ monitoring tool. It consists of illuminating the substrate surface using a light source and collecting the diffused light with a spectrometer. The on-line information allows monitoring the point of stoichiometry of the grown layer. In this work, we propose an alternative approach of this method, replacing the spectrometer by a standard webcam. This system allows to precisely choose the analyzed area on the substrate surface, which may be the whole sample surface or just a specific zone. We have grown CuInSe2 (CIS) thin films by co-evaporation under vacuum using the three-stage process. We have simultaneously performed CIS growth on both Mo-coated and bare glass substrates within the same growth run, while, on purpose, the scattered light was collected from the Mo-coated substrate. The CIS thin films were characterized by X-ray diffraction, atomic force microscopy, Hall effect measurements, absorption spectroscopy and energy dispersive spectroscopy for composition. By interrupting the CIS growth at different stages of the growth process, we have correlated the scattered light features with the Cu-rich/In-rich transitions and we observe the reproducibility of the scattered light spectra structures.

International audience; We report here on the study of the optical properties of ZnCdSe-ZnSe quantum structures elaborated by metal-organic chemical vapour deposition on GaAs substrates. The band structure of these samples is experimentally investigated by means of photoluminescence and photoreflectance spectroscopy. This makes clear the relationship between strain, carrier confinement and excitonic effects. We have computed for the first time heavy- and light-hole excitons associated with ground and excited states sub-bands, in the context of a self-consistent two-parameter trial function.

International audience; CdS thin films were grown on different substrates (glass, GaAs, Si, Al2O3) by CBD. The rms roughness of the CdS layers, measured on AFM pictures, ranges from 11 to 95 nm depending on the chemical nature of the substrate Thermal annealing of the samples leads to an improvement of the CdS crystalline quality with a conversion from cubic to hexagonal phase, whatever substrate is used, as assessed by XRD. Thermal annealing also improves the optical properties. While as-grown CdS layers photoluminescence is due to defect related emission around 1.7eV, annealed samples show dominant near band edge photoluminescence emission around 2.4 e V.

We report on a quantitative analysis of the band gap of hexagonal GaN epilayers in terms of the joint contributions of the actual wurtzite symmetry on the one hand and of residual strain fields on the other hand. This investigation leads to revision of the previous modelings based on quasicubic descriptions of the valence-band physics and gives ${\mathrm{\ensuremath{\Delta}}}_{1}$=10\ifmmode\pm\else\textpm\fi{}0.1 meV, ${\mathrm{\ensuremath{\Delta}}}_{2}$=6.2\ifmmode\pm\else\textpm\fi{}0.1 meV, and ${\mathrm{\ensuremath{\Delta}}}_{3}$=5.5\ifmmode\pm\else\textpm\fi{}0.1 meV. Last we propose a set of deformation potentials for the hexagonal GaN semiconductor.

International audience; Long-wavelength optical phonons of Ga1-xAlxN solid solutions have been identified in a wide compositional range by Raman spectroscopy. The Al and El polar phonon frequencies evolve continuously with x from one-member crystal to the other. The same behavior seems to hold true for the silent B-1 mode, which manifests itself by an interference with an unidentified continuum. Coupling of the longitudinal-optic (LO) modes associated with the two types of bonds, via the macroscopic electric field, is treated by a generalization of the dielectric model [D. T.Hon and W. L,. Faust, J. Appl. Phys. 1, 241 (1973)]. This approach accounts for the observed frequencies and supports the apparent one-mode behavior of the polar LO phonons. (C) 1998 American Institute of Physics.