1. Spectral Characteristics of an Oblique-Incidence Reflection Interferometer as a Refractive Index Sensor
- Author
-
V. A. Simonov and V. S. Terentyev
- Subjects
010302 applied physics ,Materials science ,business.industry ,Physics::Optics ,Dielectric ,01 natural sciences ,Atomic and Molecular Physics, and Optics ,Electronic, Optical and Magnetic Materials ,010309 optics ,Interferometry ,Optics ,Q factor ,0103 physical sciences ,Spectral width ,Reflection (physics) ,Figure of merit ,Photonics ,business ,Refractive index - Abstract
A sensor of refractive index of analytical liquid operating in the Kretschmann geometry and based on an oblique-incidence reflection interferometer (RI) is simulated for the first time, and its spectral properties are investigated. The principle of operation of the sensor is based on the effect of inverted surface plasmon resonance (ISPR). The sensitive structure represents the metal–dielectric multilayer coating consisting of thin nickel film in combination with quarter-wave dielectric layers. Simulation of the principle of RI fabrication under oblique incidence of light is described. Expressions governing sensitivity, spectral width of the ISPR-induced maximum in reflection, along with the figure of merit, are derived. It is demonstrated that this type of sensor can exhibit extremely high values of the figure of merit (>103) due to high Q factor.
- Published
- 2021
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