1. Linear voltage recovery after a breakdown in a pulsed dc system
- Author
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Dan Wang, Anton Saressalo, Flyura Djurabekova, Helsinki Institute of Physics, and Department of Physics
- Subjects
Condensed Matter - Materials Science ,Nuclear and High Energy Physics ,Materials science ,Physics and Astronomy (miscellaneous) ,010308 nuclear & particles physics ,Pulsed DC ,Materials Science (cond-mat.mtrl-sci) ,FOS: Physical sciences ,Physics - Applied Physics ,Surfaces and Interfaces ,Mechanics ,QC770-798 ,Applied Physics (physics.app-ph) ,01 natural sciences ,114 Physical sciences ,Recovery period ,Breakdown rate ,Nuclear and particle physics. Atomic energy. Radioactivity ,0103 physical sciences ,Limit (music) ,SIMULATION ,010306 general physics ,Energy (signal processing) ,Overall efficiency ,Voltage - Abstract
Breakdowns may occur in high-voltage applications even in ultrahigh vacuum conditions. Previously, we showed that it is important to pay attention to the post-breakdown voltage recovery in order to limit the appearance of secondary breakdowns associated with the primary ones. This can improve the overall efficiency of the high-voltage device. In this study, we focus on the optimization of the linear post-breakdown voltage recovery, with the principle aim of alleviating the problem of the secondary breakdowns. We investigate voltage recovery scenarios with different starting voltages and slopes of linear voltage increase by using a pulsed dc system. We find that a higher number of pulses during the voltage recovery produces fewer secondary BDs and a lower overall breakdown rate. Lowering the number of pulses led to more dramatic voltage recovery resulting in higher breakdown rates. A steeper voltage increase rate lead to a more localized occurrence of the secondary breakdowns near the end of the voltage recovery period. It was also found that the peak BD probability is regularly observed around 1 s after the end of the ramping period and that its value decreases exponentially with the amount of energy put into the system during the ramping. The value also decays exponentially with a half-life of (1.4$\pm$0.3) ms if the voltage only increased between the voltage recovery steps., Comment: 10 pages, 6 figures
- Published
- 2021
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