1. Imaging Ultrafast Dynamical Diffraction Wave Fronts in Strained Si with Coherent X Rays
- Author
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Mariana Verezhak, Klaus Wakonig, Angel Rodriguez-Fernandez, Anand Harihara Subramonia Iyer, Dina Carbone, Magnus Hörnqvist Colliander, and Ana Diaz
- Subjects
Free electron model ,Diffraction ,Physics - Instrumentation and Detectors ,Materials science ,FOS: Physical sciences ,Physics::Optics ,General Physics and Astronomy ,Applied Physics (physics.app-ph) ,02 engineering and technology ,01 natural sciences ,law.invention ,Optics ,law ,0103 physical sciences ,010306 general physics ,Condensed Matter - Materials Science ,business.industry ,Surface strain ,Materials Science (cond-mat.mtrl-sci) ,Diffraction effect ,Instrumentation and Detectors (physics.ins-det) ,Physics - Applied Physics ,021001 nanoscience & nanotechnology ,Laser ,Monochromatic color ,0210 nano-technology ,business ,Ultrashort pulse ,Beam (structure) ,Optics (physics.optics) ,Physics - Optics - Abstract
Dynamical diffraction effects in thin single crystals produce highly monochromatic parallel x-ray beams with a mutual separation of a few microns and a time delay of a few femtoseconds-the so-called echoes. This ultrafast diffraction effect is used at X-Ray Free Electron Lasers in self-seeding schemes to improve beam monochromaticity. Here, we present a coherent x-ray imaging measurement of echoes from Si crystals and demonstrate that a small surface strain can be used to tune their temporal delay. These results represent a first step toward the ambitious goal of strain tailoring new x-ray optics and, conversely, open up the possibility of using ultrafast dynamical diffraction effects to study strain in materials.
- Published
- 2021
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