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Your search keyword '"Wu, Wenli"' showing total 3 results
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3 results on '"Wu, Wenli"'

1. Life Prediction for Vacuum Fluorescent Display Based on Curve Fitting of Brightness Decay

Author

Yan Zhijiang, Zhu Wen-Qing, Zhang Jianping, and Wu Wenli

Subjects
Physics, Brightness, business.industry, Cathode, law.invention, Display device, Stress (mechanics), Acceleration, Optics, law, Curve fitting, business, Vacuum fluorescent display, Weibull distribution
Abstract

In order to estimate the life-time of vacuum fluorescent display (VFD) in a short time, a constant stress accelerated life test was performed by increasing its cathode temperature. The fitting of the brightness decay curve for VFD was achieved by applying the Weibull function to describe the brightness decay and the Least Square Method (LSM) to estimate the distribution parameters. Furthermore, the brightness decay formula in the normal stress, which was employed to design the initial brightness for the VFD according to life-time requirements of the users, was determined by the acceleration parameter. The numerical results show that the predicted life-time has a high accuracy, and that the brightness decay formula can provide some significant guideline to manufacturers and technicians for life-time estimation and initial brightness design.

Published
2011

2. A Study of Accelerated Life Test of White OLED Based on Maximum Likelihood Estimation Using Lognormal Distribution.

Author

Zhang, Jianping, Liu, Fang, Liu, Yu, Wu, Helen, Wu, Wenli, and Zhou, Aixi

Subjects
LOGNORMAL distribution, ACCELERATED life testing, ANALYSIS of variance, STANDARD deviations, LIGHT emitting diodes
Abstract

In this paper, accelerated life tests of white organic light-emitting diodes (WOLEDs) are conducted to obtain failure data at normal operation conditions. The lognormal distribution function was applied to describe WOLED life distribution. Log mean and log standard deviation were determined by maximum likelihood estimation. The Kolmogorov–Smirnov test was performed, and the results further confirmed that WOLED life met the lognormal distribution. Numerical results indicated that WOLED life followed the lognormal distribution. It was also found that the acceleration model was consistent with inverse power law. [ABSTRACT FROM AUTHOR]

Published
2012
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3. Constant-Step-Stress Accelerated Life Test of White OLED Under Weibull Distribution Case.

Author

Zhang, JianPing, Zhou, TingJun, Wu, Helen, Wu, Yu, Wu, WenLi, and Ren, JianXing

Subjects
ORGANIC light emitting diodes, LEAST squares, DISTRIBUTION (Probability theory), PREDICTION theory, ESTIMATION theory, WEIBULL distribution, NUMERICAL analysis, LIGHT emitting diode testing
Abstract

In order to acquire the life information of the white organic light-emitting diode (OLED), Weibull distribution function was applied to describe the life distribution, whereas the least square method was employed to estimate the shape and scale parameters. The accelerated life equation was determined, and the statistics and analysis on constant-stress and step-stress test data were performed using the software developed by the authors. The numerical results indicate that Weibull distribution and the inverse power law are both consistent with the employed assumptions and that the accurately calculated acceleration parameters enable a rapid estimation of the white OLED life. [ABSTRACT FROM AUTHOR]

Published
2012
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