1. Optical MEMS Accelerometers
- Author
-
Prasant Kumar Pattnaik and Balasubramanian Malayappan
- Subjects
Microelectromechanical systems ,Physics ,Acceleration ,Deflection (physics) ,Acoustics ,Fictitious force ,Miniaturization ,Proof mass ,Accelerometer ,Noise floor ,Computer Science::Other - Abstract
This chapter presents a brief review of the sensing techniques and interrogation methods used in optical micro-electro-mechanical-system (MEMS) and nanophotonic accelerometers. Most micromachined accelerometers work on the same basic principle. The proof mass attached to a compliant suspension experiences inertial force in response to acceleration of the body/frame. The deflection of the proof mass or the deformation of the suspension are transduced and form the metric for acceleration measurement. Special purpose satellites orbiting Earth enable determination of any object with a high degree of precision. Invention and evolution of MEMS technology has resulted in miniaturization of these position tracking devices such that they are hand-held and can be carried around. The resolution of an accelerometer depends on the noise floor of the system, including both mechanical and electrical noise. Optical sensing techniques involve change in properties of light signal due to deflection of proof mass due to inertial force.
- Published
- 2021