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Features several test and measurement used in the electronics industry. Jitter subcomponent analysis from Agilent Technologies; DPG1100 industrial pressure and vacuum gauge from Omega; Modula EMC test system from Schaffner EMC; Adamview data acquisition software from Advantech Automation.

The article features several automatic test equipment systems for high-volume, high-speed production test of semiconductor devices, including the NI PXIe-4139, a high-power, high-precision source measure unit (SMU) from National Instruments, the LitePoint zSeries RFIC tester from LitePoint, and the B1500A semiconductor device analyzer from Agilent's Hachioji Semiconductor Test Division.

The article discusses testing components, and systems with RF/microwave communications capabilities. Riadh Said, signal generators platform manager at Agilent Technologies Inc.'s microwave and communications division, told that the new X-Series Signal Generators can address a range of applications including emerging IEEE 802.1 lac wireless networking equipment. Test equipment maker Anritsu is also adapting its signal generators for radar test.

The article discusses the increase in the use of modular test instrument for radio frequency (RF) and microwave instruments. Agilent Technologies Inc. RF and Microwave applications engineer Mike Millhaem states that modular test equipments has several advantages such as smaller footprint, lower costs, and faster execution speeds. Furthermore, Aeroflex Test Solutions Group product manager Hiren Joshi, says that these instruments result in faster instrument development to meet market demands.

A list of companies that offer automated test equipment, which include Agilent Technologies, Geotest-Marvin Test Systems, and National Technical Systems, is presented.

The article discusses the state of test technology and the needs of the test and measurement equipment industry. It presents comments from several test and measurement equipment vendors on how new technologies such as multiple input-multiple output systems (MIMO), Long Term Evolution (LTE) and DigRF impact radio frequency (RF) and microwave testing. The executives who presented their comments include Carla Feldman of Agilent Technologies Inc. and engineers at Keithley Instruments Inc. Related issues are further elaborated including advances in test equipment and digital oscilloscopes.

The article discusses the role and advantages of synthetic instrumentation (SI) system. SI uses a collection of basic hardware and building blocks in a flexible, open and modular architecture to combine the stimulus and measurement functions needed by a given test application. It explains the transition of virtual instruments (VI), built-in software executed on a personal computer (PC) or laptop and which were invented by National Instruments Corp., to SI. The features of synthetic instruments from Aeroflex, Agilent Technologies Inc., National Instruments and Phase Matrix Inc. are also highlighted.

The article presents a comparison of audio-video test instruments including products from Agilent Technologies, Extron Electronics and Kaltman Creations.

This section offers a list of companies that offer automated test equipment in the U.S. This include Advanced Vehicle Technologies, Advantest America and Agilent Technologies.

The section presents a list of companies that offer automated test equipment, including Acqiris, GOEPEL electronic, Incal Technology, Qualectron Systems, Advanced Testing Technologies, Aeroflex, Agilent Technologies, Credence Systems, Digalog Systems, National Instruments, Vitrek and VXI Technology.

Presents a list of companies that manufacture or rent instrumentation products. Aeroflex; Agilent Technologies; Avtech Electrosystems; Bird Technologies.

The article presents information on the companies showcasing their products at the 2006 IEEE MTT-S Radio and Wireless exhibition. Some of the companies that are participating in the exhibition are: Advanced Test Equipment Corp., which offers rental, sale and lease solutions for test and measurement requirements; Anethercomm Inc., which is a leading provider of high power linear and pulsed solid-state power amplifiers; Agilent Technologies, which is a global technology leader in communications, electronics, life sciences and chemical analysis.

This article deals with the challenges of wireless local area network test facing designers in the Wireless Fidelity (WiFi) field. For one thing, the protocols are more complex, according to Thomas Alexander, chief technology officer at VeriWave. The dynamic-configuration aspects of WiFi allows endpoint stations to query access points (AP) to gain network access and has AP announce the services they support. Designers of wireless-network devices, however, cannot assume a controlled environment. WiFi shares its frequency band with Bluetooth, portable phones, and microwave ovens, among other radio frequency (RF) sources. Agilent Technologies created the N4010A wireless-connectivity test set, which uses software modules to implement signal- and vector-analysis functions, as well as signal generation, and to form a more self-contained RF-test package. Engineers must test WiFi using the RF link to exercise functions such as rate adaptation, hidden-node detection and other signal-strength-dependent conditions. Further complicating the test setup, however, is the mobile aspect of WiFi. To meet the ever-changing needs of WiFi designs is WiFi testing's ultimate challenge. National Instruments is taking the programmability approach in its RF-test system, according to Darcy Dement, modular-instrument product manager.

Reports on the evolution of logic analyzers to meet the demands of powerful new technologies. Hardware and software improvements; Logic analyzers from Tektronix Inc. and Agilent Technologies Inc.; Increase of data bandwidth; Enabling of designers to cope with gigahertz microprocessors and faster buses in complex digital systems. INSETS: Probing Problems With DDR SDRAM;MSOs Lure Oscilloscope Users.

The article outlines several signal generators for radio frequency (RF)/microwave testing. It says that Agilent Technologies Inc.'s E8267D PSG signal generator provides all major digital modulation formats with a modulation bandwidth of 160 megahertz (MHz). Meanwhile, National Instruments Corp.' NI565x series of modular signal generator is based n the PXI format, with a control module to create.

The article evaluates several test instruments including the Infiniium 9000 series of oscilloscopes from Agilent Technologies Inc., RSA6000 oscilloscopes from Tektronix Inc., and AUIRS4427S dual low-side driver integrated circuit (IC) from IR.

The article provides information on developments in radio frequency (RF) and microwave test equipment and software. At the AutoTestCon show held in Baltimore, Maryland from September 18-20, 2007, Agilent Technologies announced the latest news on the Agilent Virtual Rack platform. The local-area-network (LAN)-based standard LAN Extension for Instrumentation (LXI) is gaining momentum in a wide range of commercial and military automatic-test equipment (ATE) applications.

Presents a directory of companies in the U.S. testing equipment industry, including oscilloscope supplier Agilent Technologies.

The article evaluates several electronic test and measurement instruments, including the XL OCS controller from Omega, the EtherScope Network Assistant from Fluke Networks, and Agilent N4374B lightwave component analyzer from Agilent Technologies Inc.

The article presents information on an automatic memory tester set for flash, multichip packages. Agilent Technologies Inc. has launched a final test memory tester targeting multichip packages (MCPs) and discrete flash. Dubbed the Versatest Series Model V5500, this automatic test equipment system offers a tester-per-site architecture. The system can radically reduce the cost of test by permitting both high-parallel and single-insertion testing of MCPs.

Features several wireless local area network testers. Design of R4870 Radio Communication Tester from Advantest America Measuring Solutions Inc.; Description of Bluetooth analyzer and exerciser from Computer Access Technology Corp.; Specification of N4010A wireless connectivity test set from Agilent Technologies Inc.

Introduces several innovations aimed at addressing the jitter challenge in high-speed high-data volume systems in the U.S. Capability of the touchscreen-equipped 86100c Infiniium digital communication analyzer from Agilent Technologies Inc. to accurately separate random and deterministic jitter; Usability of the differential clock recovery module in acquiring differential electrical signals; Effectiveness of the BA1500 bit-error-rate tester and analyzer in blocking errors and error-free interval statistics.

The article reviews several test and measurement products including the NI PXIe-5646R vector signal transceiver from National Instruments, the Agilent EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer from Agilent Technologies Inc., and the AWG18 arbitrary waveform generator from Applicos BV.

The article offers brief information on several products including the M8000 Series BER test solution from Agilent Technologies Inc., a medical equipment internal power supply from GlobTek Inc., and the HWSSHK 304 and 316L stainless steel IP66 wall mount enclosures from Hammond Manufacturing Ltd.

The article offers brief information on the U4154A test and measurement equipment from Agilent Technologies Inc.

The article evaluates the E6601A integrated wireless communications test system from Agilent Technologies Inc. and offers information on its features.

Provides information on the testing of wireless devices in real world conditions. Problem caused by the air interface between the wireless device and the cellular base station; Similar service provided by Radio Link Protocol and Transmission Control Protocol; Features of the Agilent Technologies 8960 one-box test set.

Introduces Agilent Technologies Inc.'s platform for testing multiple services in carrier networks. Agilent's existing technologies combined to create the platform; Capability for testing frame relay and asynchronous transfer mode traffic; Operation of the tester on several levels to test frame integrity.

Focuses on the introduction of the calibration service for electronic test equipment used in general purpose applications by electronics company Agilent Technologies Inc. Target market of the service; Equipment used by the company for the calibration services; Types of calibration services offered by the company.

Features the serial bit-error-ratio test instruments from Agilent Technologies Inc. that offer differential inputs and outputs, integrated clock data recovery, and jitter measurement and analysis. Key specifications of N4901A and N4902A; Prices; Shipment schedule.

Focuses on Agilent Technologies Inc.'s introduction of professional service programs aimed at manufacturers using Agilent's 3070 in-circuit test system.

Reports on the availability of RouterTester Internet Protocol-based test system for routers from Agilent Technologies. Monitoring of throughput, latency and packet loss; Incorporation of packets over SONET interfaces.

The article reports on the challenges facing the test-and-measurement equipment designers in providing practical solutions. It cites an increase in on-site measurements, which require an increasing number of portable radio frequency (RF)/microwave test equipment. It highlights several manufacturers that respond to the market needs such as Agilent Technologies Inc., which offers a portable FiledFox spectrum and Anritsu Co., which introduces Site Master portable RF/microwave testers.

The article previews several evaluation engineering products including the ASD Series of industrial-grade solid-state drives (SSD) from Adlink Technology, the AX-Series Test Systems from Aeroflex, and the 8990B Peak Power Analyzer from Agilent Technologies.

The article offers information on the use of the peripheral component interconnect (PCI) eXtensions for Instrumentation (PXI) open standard in modular testing instruments. It says PXI-based modular instruments are rugged, low cost, and delivers high-performance measurement and automation of systems. Agilent Technologies Inc. Radio Frequency (RF) and Microwave applications engineer Mike Millhaem says that PXIs provides a good starting point for RF and Microwave modular instruments.

The article features several testing instruments and analyzers, including the CS9000 Broadband Signal System (BSS) from Aeroflex, the N9342C Hand-Held Spectrum Analyzer (HSA) from Agilent Technologies, and the ProDAQ 3030.

The article evaluates several daio frequency/microwave test equipment including the model PSG E8257D signal generator from Agilent Technologies Inc., 2500B series of microwave signal generators from Giga-Tronics Inc., and VectorStar model ME7828A vector network analyzers from Anritsu Co.

The article evaluates several products, including the 100 GE development-accelerator system from Ixia, the 40/100-Gigabytes per second (Gbps) BER tester from Agilent Technologies, and the MP1800A signal analyzer from Anritsu.

The article evaluates test and measurement equipment including the PXI modular instrument chassis from National Instruments Corp. and the Agilent 6000L LXI (LAN Extension for Instrumentation) from Agilent Technologies Inc.

The article features several engineering-related products including the Agilent E6601A test set platform from Agilent Technologies for wireless device calibration, the Model 3500 Portable RF Power Meter from Keithley Instruments and the ProVision dot6 testing software from JTAG Technologies.

Presents information on test equipment released in the market. CH2 High-Voltage Wiring Harness/Backplane Analyzer from Cirris Systems; Infinium 80000B Series of oscilloscopes from Agilent Technologies; Model 2910 RF Vector Signal Generator from Keithley Instruments.

Provides information on a diversified collection of hardware, software, and test equipment which represents those that are created in 2003. Companies that continue to develop cost-effective products with high-performance levels in the electronics industry; Features of RF Design Environment software tools from Agilent Technologies; Switching speed capability of the ADV-3000S DDS source from Advanced Radio Corp. INSET: Top Products of 2003 at a glance (listed alphabetically).

Evaluates several testing equipment for electronic products. MP1590A Network Performance Tester from Anritsu; N6700 Modular Power Systems from Agilent Technologies; BA1500 BitAlyzer, Bit-Error-Rate Tester and Analyzer from Noise Com.

Reports on the introduction of E2930A Exerciser and Protocol Analyzer test tools for PCI-X 2.0 development by Palo Alto, California-based Agilent Technologies Inc.

Features Agilent Technologies Inc.'s E2950 series of test instruments. Specifications; Applications.

Introduces several test, measurement and control equipment for engineering design. Waveform generator from Agilent Technologies Inc.; Machine Guard MG-4 on-line unit for measuring bearing conditions from SPM Instrument Inc.; Linear encoder from Heidenhain Corp. INSET: Rick DeMeis on Test, Measurement & Control.

The article previews several electronic products used for test and measurement, including the WT300 series digital power meters from Yokogawa Corp. of America, the Infiniium 9000 H-Series scopes from Agilent Technologies, and the iFLOW-200 thermal and hydraulic system from Advanced Thermal Solutions.