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This article proposes a new necessary condition and the corresponding speedup strategies to the threshold function (TF) identification problem. The state-of-the-art to this identification problem could be very time-consuming when the function-under-identification is a non-TF with the unateness property. The proposed new necessary condition can be seamlessly integrated into this identification algorithm. As compared with the state-of-the-art, the improved identification algorithm with the proposed necessary condition can more effectively and efficiently detect non-TFs. Furthermore, according to the experimental results, the ratio of CPU time overhead in the process of checking the proposed necessary condition for identifying all the 8-input TF is only 0.1%. [ABSTRACT FROM AUTHOR]

Memristor, which is a two-terminal nanodevice, widely used in various fields, e.g., machine learning and neuromorphic systems, has attracted much attention these years. Memristor can also be used to realize an implication logic gate and thus logic circuits. However, the fanouts in a memristor-based logic circuit have some constraints and need to be processed with special care. On the other hand, in addition to the number of memristors, the number of operational pulses is another metric to measure the quality of a memristor-based logic circuit. Hence, in this paper, we propose a synthesis algorithm to deal with the fanout problems in memristor-based logic circuits using implication logic gates for having a minimal number of operational pulses. We conducted experiments on a set of MCNC benchmarks. The experimental results show that the proposed algorithm can reduce 29% operational pulses and 36% memristor count on average compared with the state-of-the-art. [ABSTRACT FROM AUTHOR]

Single-electron transistor (SET) at room temperature has been demonstrated as a promising device for extending Moore’s law due to its ultralow power consumption. However, early realizations of SET array lacked variability and reliability due to their fixed architectures and high defect rates of nanowire segments. Therefore, a reconfigurable version of SET was proposed to deal with these issues. Recently, several automated mapping approaches have been proposed for area minimization of reconfigurable SET arrays. However, to the best of our knowledge, seldom mapping algorithms that consider the existence of defective nanowire segments were proposed. Furthermore, before the defect-aware mapping, we have to know the locations of defects in SET arrays. Thus, this paper presents the first diagnosis approach to identify the locations of defects in SET arrays followed by two defect-aware algorithms for mapping SET arrays in different scenarios. The experimental results show that the proposed diagnosis method can detect 100% of defects under a defect rate and distribution in SET arrays. As for the mapping algorithms, the results show that our approach can successfully map the SET arrays with 11.13% and 7.69% width overhead on average in the baseline detour mapping algorithm and defect-reuse mapping algorithm, respectively, in the presence of 5000-ppm defects. [ABSTRACT FROM AUTHOR]

Node merging is a popular and effective logic restructuring technique that has recently been applied to minimize logic circuits. However, in the previous satisfiability (SAT)-based methods, the search for node mergers required trial-and-error validity checking of a potentially large set of candidate mergers. Here, we propose a new method, which directly identifies node mergers using logic implications without any SAT solving calls. Although the efficiency benefits of the method come at the expense of quality, we further engage the redundancy removal and the wire replacement techniques to enhance its quality. The experimental results show that the proposed optimization method achieves approximately 46 times the speedup while possessing a competitive capability of circuit minimization compared to the state-of-the-art method. [ABSTRACT FROM PUBLISHER]