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The paper describes the physicochemical methods by which semiconductor objects can be diagnosed. The goal is to use these objects to monitor one of the toxic components of the chemical industry, ammonia gas. Semiconductor solid solutions based on binary compounds of cadmium telluride and zinc sulfide were chosen as objects of study. Using elementary methods, the possibility of determining the nature of the surface properties of semiconductors is shown. It is on them that the choice of the most sensitive sample to ammonia is based. [ABSTRACT FROM AUTHOR]