1. Raman and XPS studies of CIGS/Mo interfaces under various annealing temperatures.
- Author
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Han, Junfeng, Ouyang, Liangqi, Zhuang, Daming, Liao, Cheng, Liu, Jiang, Zhao, Ming, Cha, Li-mei, and Besland, M.-P.
- Subjects
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INTERFACES (Physical sciences) , *ANNEALING of metals , *EFFECT of temperature on metals , *RAMAN spectroscopy , *METALLIC thin films , *X-ray photoelectron spectra - Abstract
In this work, copper indium gallium selenide (CIGS) thin films were prepared by sputtering CIGS quaternary target and subsequent annealing in the 450–550 °C range. For analyses purpose, the films were peeled off from Mo-coated glass and both parts were named as ‘CIGS side’ and ‘Mo side’ respectively. Raman spectroscopy and X-Ray Photoelectron Spectroscopy (XPS) were performed to identify crystalline phases and chemical compositions. On the ‘Mo side’, a MoSe x layer was evidenced with increased thickness for higher annealing temperature. On the ‘CIGS side’, XPS highlighted a continuous Ga enrichment and a Cu content decrease with increasing temperature. Na was detected on both Mo and CIGS sides. Its concentration and distribution relied on the temperature. Finally, relationships between interface modifications and annealing temperature were discussed . [ABSTRACT FROM AUTHOR]
- Published
- 2014
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