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Your search keyword '"Baudoin F"' showing total 3 results
Start Over Author "Baudoin F" Topic atomic force microscopy
3 results on '"Baudoin F"'

1. Sensitivity analysis of the electrostatic interaction between the atomic force microscopy probe and a thin dielectric film with 3D-localized charge cloud.

Author

Baudoin, F., Villeneuve-Faure, C., Teyssedre, G., Azib, M., Binaud, N., Bugarin, F., and Segonds, S.

Subjects
*ATOMIC force microscopy, *ELECTROSTATIC interaction, *DIELECTRIC films, *FINITE element method, *PERMITTIVITY, *COMPUTER simulation
Abstract

Recent experimental studies have demonstrated that the Electrostatic Force Distance Curve (EFDC) can be used for space charge probing in thin dielectric layers. Experiments highlight that this method seems to be sensitive to charge localization. However, the relative contributions of charge distribution parameters (density, lateral/in-depth spreading) remain unknown. The aim of this paper is to determine the contribution of each charge distribution parameters to EFDC. To reach this aim, we have developed an electrostatic and an electromechanical model to simulate EFDC over a charge cloud trapped in a thin dielectric layer. Hence, the EFDC sensitivity to charge localization could be investigated through the shape parameters of the charge cloud and by extracting the respective contributions from the atomic force microscopy tip and the cantilever. [ABSTRACT FROM AUTHOR]

Published
2019
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2. 3D modelling of electrostatic force distance curve between the AFM probe and dielectric surface

Author

Boularas, A., Baudoin, F., Gilbert Teyssedre, Villeneuve-Faure, C., Clain, S., LAboratoire PLasma et Conversion d'Energie (LAPLACE), Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées, Diélectriques Solides et Fiabilité (LAPLACE-DSF), Université Fédérale Toulouse Midi-Pyrénées-Université Toulouse III - Paul Sabatier (UT3), Institut de Mathématiques de Toulouse UMR5219 (IMT), Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Université Toulouse 1 Capitole (UT1), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Université Toulouse - Jean Jaurès (UT2J)-Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS), Université de Toulouse (UT)-Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT), Université de Toulouse (UT)-Université Toulouse III - Paul Sabatier (UT3), Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université Toulouse - Jean Jaurès (UT2J), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS), Centre of Physics of the University of Minho (CFUM), Universidade do Minho, and Teyssedre, Gilbert

Subjects
[SPI]Engineering Sciences [physics], [SPI] Engineering Sciences [physics], Finite volume, Atomic Force Microscopy, Ciências Naturais::Matemáticas
Abstract

Techniques derived from the near-field microscopies and particularly the Atomic Force Microscopy (AFM) are presented as alternative techniques for measurement of space charge compared to classical techniques due to their high sensitivity to the electrostatic force and a better resolution (≈ nm). One of the AFM derivative techniques which allow obtaining information on the charge state of the dielectric materials is based on the technique of Force Distance Curves (FDC) obtained by cycle of approach and retracts between the AFM probe and the dielectric. In this paper, three-Dimensional (3D) simulation results for the electrostatic force between an Atomic Force Microscope (AFM) tip and the surface of a dielectric are presented for different AFM tip geometries. The first aim is to analyse the effect of the geometric parameter on force-distance curves without contribution of the cantilever as AFM detection mode for electrostatic charges. At the second time the sensor is composed of a cantilever supporting a conical tip terminated by a spherical apex, we investigate in a second step is to see the effect of the cantilever on force distance curve. Simulation results are shown and compared with experimental data in order to validate our approach., Fundação para a Ciência e a Tecnologia (FCT)

Published
2014

3. 3D modeling of electrostatic interaction between atomic force microscopy probe and dielectric surface: Impact of tip shape and cantilever contribution.

Author

Boularas, A., Baudoin, F., Teyssedre, G., Villeneuve-Faure, C., and Clain, S.

Subjects
*ELECTROSTATIC interaction, *ATOMIC force microscopy, *DIELECTRIC materials, *CANTILEVERS, *SIMULATION methods & models
Abstract

Techniques derived from the near-field microscopies and particularly the Atomic Force Microscopy (AFM) are presented as alternative techniques for space charge measurement compared to classical techniques due to their high sensitivity to the electrostatic force and an improved spatial resolution (few nanometers). One of the AFM derivative methods, which allow obtaining information on the charge state of the dielectric materials, is based on the measurement of Force Distance Curves (FDC) obtained by cycling approach and retraction of the AFM probe to the dielectric surface. In this paper, three-Dimensional (3D) simulation results for the electrostatic force between an AFM tip and the surface of a dielectric are presented for different AFM tip geometries. The first aim is to analyse the effect of tip shape on electrostatic contribution to force-distance curves. The second step consists in extracting cantilever contribution to electrostatic force. Finally, a model merging cantilever and tip shape contributions is developed. Simulation results are shown and compared with experimental data in order to validate our approach. [ABSTRACT FROM AUTHOR]

Published
2016
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