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In this article, we first calculate gamma-ray exposure buildup-factors of some radiation-resistant glasses and radiation-protective glasses by using the Geometric Progression (G-P) fitting method. And then we analyze variations of the exposure buildup-factor with the incident photon energy and penetration depth. The results show that exposure buildup-factors strongly associate with photon energy and penetration depth. Exposure buildup-factors calculated in this article are useful for the design of a peer window used in nuclear industry. [ABSTRACT FROM AUTHOR]

The matrix effect has a major impact on energy-dispersive X-ray fluorescence analysis (EDXRFA) and is difficult to be evaluated due to that the contents of some low-atomic-number elements cannot be identified by in-situ EDXRFA. Up to today, the fundamental parameter algorithm proposed by Rousseau has been widely applied to correct the matrix effect. Accordingly, determining the matrix and mass attenuation coefficient ( μ/ ρ) of sample is a key issue for the fundamental parameter algorithm. In present work, the method to deduce μ/ ρ by effective atomic number ( Zeff) was studied. First, the relationship between Zeff and coherence to Compton scatting ratio ( R) of the incident X-ray was determined by standard samples. Then, we deduce Zeff and their μ/ ρ. The value of μ/ ρ deduced by our method is in good agreement with that calculated by WinXCOM, and the relative change (Δ) is less than 7%. We also deduced Zeff and their μ/ ρ of Chinese national standard soil samples employing our method and good agreement with the calculated values were also obtained. We found that the agreement between experimental values of μ/ ρ with theoretical values by WinXCOM still exists when the energy of the incident X-ray is greater than 4 keV, and the Δ is less than 10%. The result indicates that our method may be applied directly to in-situ EDXRFA. [ABSTRACT FROM AUTHOR]