1. Low-Noise Avalanche Photodiode in Standard 0.35-μm CMOS Technology.
- Author
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Pancheri, Lucio, Scandiuzzo, Mauro, Stoppa, David, and Dalla Betta, Gian-Franco
- Subjects
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COMPLEMENTARY metal oxide semiconductors , *DIGITAL electronics , *LOGIC circuits , *TRANSISTOR-transistor logic circuits , *ELECTROOPTICAL devices , *INTEGRATED optics - Abstract
In this paper, we report on an Avalanche Photodiode (APD) fabricated in a standard 0.35-μm CMOS technology. The main electrooptical characteristics of the device are presented, showing a remarkably tow-noise factor if compared to other CMOS APDs. An estimation of the noise properties of a pixel based on the proposed photodiode with charge-amplifier readout is performed, showing that it could have an improved noise performance with respect to a standard photodiode-based pixel. [ABSTRACT FROM AUTHOR]
- Published
- 2008
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