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Your search keyword '"Wachter, J. De"' showing total 1 results
Start Over Author "Wachter, J. De" Topic backscattering
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1. Growth and properties of ion beam synthesized Si/CoxNi1-xSi2/Si(111) structures.

Author

Wu, M. F., Wachter, J. De, Van Bavel, A.-M., Pattyn, H., Langouche, G., Vanhellemont, J., Bender, H., Temst, K., Wuyts, B., and Bruynseraede, Y.

Subjects
*ION bombardment, *SILICIDES, *BACKSCATTERING, *SPECTRUM analysis
Abstract

Provides information on a study that reported on the quality, strain and orientation of ion beam synthesis-formed Co[subx]Ni[sub1-x]Si[sub2] ternary silicide layers studied by Rutherford backscattering spectroscopy channeling, Auger electron spectroscopy transmission electron microscopy and x-ray diffraction. Details on the measurement of symmetric reflection and asymmetric reflection x-ray rocking curves; Requirement for preparing the ion beam synthesis-formed ternary silicide layers.

Published
1994
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