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New experimental and theoretical results for the material parameter reconstruction using terahertz (THz) pulsed spectroscopy (TPS) are presented. The material parameter reconstruction algorithm was realized and experimentally implemented to study the test sample. In order to both verify the algorithm and to estimate the reconstruction accuracy, test sample material parameters obtained with the TPS were compared with the results of the same sample studying by the use of the backward-wave oscillator (BWO) spectroscopy. Thus, high reconstruction accuracy was demonstrated for the spectral range, corresponding to the BWO sensitivity and located between 0.2 and 1.2 THz. The numerical simulations were applied for determining the material parameter reconstruction stability in the presence of white Gaussian noise in TPS waveforms as well as fluctuations in the femtosecond (FS) optical pulse duration. We report a strong dependence of the inverse problem solution stability on these factors. We found that the instability of the FS optical pulse duration used for THz pulses generation and detection limits the material parameter reconstruction with TPS. [ABSTRACT FROM AUTHOR]

In this paper, we introduce wide-aperture aspherical lens for high-resolution terahertz (THz) imaging. The lens has been designed and analyzed by numerical methods of geometrical optics and electrodynamics. It has been made of high-density polyethylene by shaping at computer-controlled lathe and characterized using a continuous-wave THz imaging setup based on a backward-wave oscillator and Golay detector. The concept of image contrast has been implemented to estimate image quality. According to the experimental data, the lens allows resolving two points spaced at 0.95λ distance with a contrast of 15%. To highlight high resolution in the THz images, the wide-aperture lens has been employed for studying printed electronic circuit board containing sub-wavelength-scale elements. The observed results justify the high efficiency of the proposed lens design. [ABSTRACT FROM AUTHOR]