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The BL28XU beamline, dedicated to rechargeable battery analysis, is described., The newly installed BL28XU beamline at SPring-8 is dedicated to in situ structural and electronic analysis of rechargeable batteries. It supports the time range (1 ms to 100 s) and spatial range (1 µm to 1 mm) needed for battery analysis. Electrochemical apparatus for battery charging and discharging are available in experimental hutches and in a preparation room. Battery analysis can be carried out efficiently and effectively using X-ray diffraction, X-ray absorption fine-structure analysis and hard X-ray photoelectron spectroscopy. Here, the design and performance of the beamline are described, and preliminary results are presented.

A tapered undulator beamline BL36XU was constructed at SPring-8 to conduct structural and electronic analysis of dynamic events on polymer electrolyte fuel cell (PEFC) cathode catalysts for the development of next-generation PEFCs. BL36XU provides various time and spatially resolved XAFS techniques in an energy range from 4.5 to 35 keV for investigating PEFCs under the operating conditions. In addition, we developed in-situ complementary measurement systems, such as in-situ time-resolved XAFS/XRD and ambient pressure HAXPES systems. This report describes the performance and present status of the BL36XU.

We have developed a quick-scanning x-ray absorption fine structure (QXAFS) system and installed it at the recently constructed synchrotron radiation beamline BL33XU at the SPring-8. Rapid acquisition of high-quality QXAFS data was realized by combining a servo-motor-driven Si channel-cut monochromator with a tapered undulator. Two tandemly aligned monochromators with channel-cut Si(111) and Si(220) crystals covered energy ranges of 4.0-28.2 keV and 6.6-46.0 keV, respectively. The system allows the users to adjust instantly the energy ranges of scans, the starting angles of oscillations, and the frequencies. The channel-cut crystals are cooled with liquid nitrogen to enable them to withstand the high heat load from the undulator radiation. Deformation of the reflecting planes is reduced by clamping each crystal with two cooling blocks. Performance tests at the Cu K-edge demonstrated sufficiently high data quality for x-ray absorption near-edge structure and extended x-ray absorption fine-structure analyses with temporal resolutions of up to 10 and 25 ms, respectively.

An x‐ray microprobe system with total‐reflection mirror optics for trace element analysis has been developed at beamline 37XU of SPring‐8. To achieve sub‐microprobe, a spatial filter has been installed downstream of a monochromator. Focusing tests have been performed in the x‐ray energy range of 6–14 keV. A focused beam size of 0.83 μm(V)×1.35 μm(H) has been obtained at an x‐ray energy of 10 keV, and using a spatial filter in the horizontal direction, the beam size is down to 0.84 μm. Micro‐x‐ray absorption fine structure (XAFS) spectroscopy of submicrometer particles has been done by utilizing the total‐reflection mirror optics. It was clearly observed from the nickel K‐edge XAFS spectra that the oxidation state of nickel was a mixture of metal and oxide even in the single submicrometer particle.

aJASRI, SPring-& Mikazuki, Sayo-gun, Hyougo 679-5198, Japan, bRIKEN, SPring-& Kamigori, Ako-gun, Hyougo 6795198, Japan, CjAERI Kansai, SPring-& Mikazuki, Sayogun, Hyougo 679-5143, Japan, dlnstitute of Scientific and Industrial Reseach, Osaka University, Ibaraki, Osaka 5670047, Japan, eFaculty of Science, Okayama University, Okayama 700, Japan, tDepartment of Molecular Engineering, Kyoto University, Kyoto 606-5801, Japan, gFaculty of Science, Osaka University, Toyonaka, Osaka 560, Japan, "Fundamental Research Laboratry, NEC, Tsukuba, Ibaragi 305, Japan. Emaihurugat@springS.or.jp

A time‐resolved quick x‐ray absorption fine structure (QXAFS) system was designed and constructed using high flux but low power quasimonochromatic undulator radiation at a helical undulator beamline, BL40XU at SPring‐8. At 12 keV, a flux of 1013 – 1014 photons/sec/0.1 % bw. was generated over an energy range of 1 keV with a total power of 7 – 15 W. A compact Si(111) channel cut monochromator having no active cooling was utilized. The monochromator was mounted on a galvano‐scanner stage within an experimental hutch. The stage could be oscillated at frequencies up to 100 Hz over a 1.4‐degree range. The Pt L3‐edge(11.6 keV) EXAFS spectra of Pt foil was measured in transmission and fluorescence modes up to k = 15 A−1 in a period of 50 ms/scan. In this report, the design of the QXAFS system and some preliminary experimental results are presented.

We are currently constructing a new X-ray absorption fine structure (XAFS) beamline BL36XU at SPring-8 dedicated for the structural and electronic analysis of the dynamic events on polymer electrolyte fuel cell (PEFC) cathode catalysts for the development of next-generation PEFCs. To investigate the cathode catalyst nanoparticles in PEFCs under the operating conditions, the beamline is designed to provide time- and spatially resolved XAFS techniques having a time resolution of 100 μs, spatial resolution of 200 nm, and depth resolution of 1 μm. We report the outline and design of the new beamline.

Beamline BL01B1 was constructed for conventional XAFS measurements using a bending magnet light source at SPring-8 in 1997 [1]. BL01B1 covers a wide energy range from 3.8 to 113 keV using an adjustable inclined double-crystal monochromator and a double mirror system. Here, we describe a newly developed apparatus and the current status of the BL01B1. A time-efficient QEXAFS method was developed to measure high quality spectra up to high-k regions in the shortest possible time. The method involves sweeping the monochromator continuously at a variable angular speed depending on the k-region using a VME stepping motor controller. During scanning, a pair of crystals of the monochromator rotates without translation motion like a channel-cut crystal. This QEXAFS method was applied to the fluorescence mode using a 19-element Ge detector combined with a digital X-ray processor system. A new conversion electron yield detector having a rotational sample stage was developed for single crystalline samples. Angular oscillations of 4 degrees in the sample rotation stage around the axis normal to the sample surface successfully remove diffraction noise in the XAFS spectra.