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compact trench-gate insulated-gate bipolar transistor model that captures MOS-side carrier injection is developed. The model retains the simplicity of a 1-D solution to the ambipolar diffusion equation, but at the same time, captures the MOS-side carrier injection and its effects on steady-state carrier distribution in the drift region and on switching waveforms. [ABSTRACT FROM AUTHOR]

Although insulated-gate bipolar-transistor (IGBT) turn-on losses can be comparable to turn-off losses, IGBT turn-on has not been as thoroughly studied in the literature. In the present work IGBT turn on under resistive and inductive load conditions is studied in detail through experiments, finite element simulations, and circuit simulations using physics-based semiconductor models. Under resistive load conditions, it is critical to accurately model the conductivity-modulation phenomenon. Under clamped inductive load conditions at turn-on there is strong interaction between the IGBT and the freewheeling diode undergoing reverse recovery. Physics-based IGBT and diode models are used that have been proved accurate in the simulation of IGBT turn-off. [ABSTRACT FROM AUTHOR]

This paper presents the application of compact insulated gate bipolar transistor and p-i-n diode models, including features such as local lifetime control and field-stop technology, to the full electrothermal system simulation of a hybrid electric vehicle converter using a lookup table of device losses. The vehicle converter is simulated with an urban driving cycle (the Federal Urban Driving Schedule), which is used to generate transient device temperature profiles. A methodology is also described to explore the converter reliability using the temperature profile, with rainflow cycle counting techniques from material fatigue analysis. The effects of ambient temperature, driving style, and converter design on converter reliability are also investigated. [ABSTRACT FROM AUTHOR]

Recently, a simulation method for power electronic devices has emerged, which has high accuracy and short run times based on a Fourier model of the devices physics. This paper describes the use of the Fourier models for diodes and insulated gate bipolar transistors (IGBTs) and implementation in MATLAB and Simulink in a formal optimization strategy. In particular, this paper investigates coupled circuit, diode, and IGBT behavior. Conclusions are drawn concerning device loading and circuit design, particularly the role stray inductance. [ABSTRACT FROM AUTHOR]

Feedback control of insulated gate bipolar transistors (IGBTs) in the active region can be used to regulate the device switching trajectory. This facilitates series connection of devices without the use of external snubber networks. Control must be achieved across the full active region of the IGBT and must balance a number of conflicting system goals including diode recovery. To date, the choice of control parameters has been a largely empirical process. This paper uses accurate device models and formalized optimization procedures to evaluate IGBT active voltage controllers. A detailed optimization for the control of IGBT turn-on is presented in this paper. [ABSTRACT FROM AUTHOR]

The operation of an insulated gate bipolar transistor (IGBT) in its active region is a well established technique for withstanding short circuits and also for dv/dt control. In this paper, we exploit the active behavior of the IGBT, applying a voltage feed- back Loop to the IGBT to control its switching. It is shown that adding a bias to the demand reference waveform shifts the IGBT into the active region and permits wide bandwidth operation over most of the switching transient. The operation of the IGBT is reported in detail, making reference to a selection of experimental waveforms for 400-A, 1700-V capsule IGBTs. The implementation required for control of such large IGBT modules and capsule devices for high power applications is described and discussed. It is concluded that the active voltage control method allows the operation of high power IGBT circuits to be closely defined. [ABSTRACT FROM AUTHOR]

Presents a study that examined circuit simulator models for the diode and insulated gate bipolar transistor (IGBT) with full temperature dependent features. Simulation of the distributed charge; Results of the study; Conclusion.

Presents a study which developed an electrothermal physics-based model for the field-stop insulated gate bipolar transistor. Characteristics of the model; Analytical description of the field-stop layer; Details of the experimental and simulation results.

Offers possible solutions on how to make series insulated gate bipolar transistors (IGBT's) attractive and challenging. Methodology used; Proposal of an approach using the IGBTs gate-controlled active regime; What this approach replaces; Characteristics of the output; Key results shown; Technique used.