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This article proposes a new necessary condition and the corresponding speedup strategies to the threshold function (TF) identification problem. The state-of-the-art to this identification problem could be very time-consuming when the function-under-identification is a non-TF with the unateness property. The proposed new necessary condition can be seamlessly integrated into this identification algorithm. As compared with the state-of-the-art, the improved identification algorithm with the proposed necessary condition can more effectively and efficiently detect non-TFs. Furthermore, according to the experimental results, the ratio of CPU time overhead in the process of checking the proposed necessary condition for identifying all the 8-input TF is only 0.1%. [ABSTRACT FROM AUTHOR]

The identification of threshold function (TF), which determines whether a Boolean function can be represented by an linear threshold logic gate (LTG) or not, is a fundamental but important task in the theories of threshold logic. In this paper, we propose a more efficient and effective algorithm of TF identification by constructing the system of irredundant inequalities and adjusting the weight assignment comprehensively. This is the first non-ILP-based approach that is able to identify all the eight-input TFs. The experimental results demonstrated that the proposed approach is more effective than all the existing non-ILP-based approaches and the LTGs obtained by the proposed approach are optimal for near 100% cases. For TFs with 9–15 inputs, the proposed approach can identify 100 000 randomly generated TFs as well in a reasonable CPU time. [ABSTRACT FROM AUTHOR]

Single-electron transistor (SET) at room temperature has been demonstrated as a promising device for extending Moore’s law due to its ultralow power consumption. However, early realizations of SET array lacked variability and reliability due to their fixed architectures and high defect rates of nanowire segments. Therefore, a reconfigurable version of SET was proposed to deal with these issues. Recently, several automated mapping approaches have been proposed for area minimization of reconfigurable SET arrays. However, to the best of our knowledge, seldom mapping algorithms that consider the existence of defective nanowire segments were proposed. Furthermore, before the defect-aware mapping, we have to know the locations of defects in SET arrays. Thus, this paper presents the first diagnosis approach to identify the locations of defects in SET arrays followed by two defect-aware algorithms for mapping SET arrays in different scenarios. The experimental results show that the proposed diagnosis method can detect 100% of defects under a defect rate and distribution in SET arrays. As for the mapping algorithms, the results show that our approach can successfully map the SET arrays with 11.13% and 7.69% width overhead on average in the baseline detour mapping algorithm and defect-reuse mapping algorithm, respectively, in the presence of 5000-ppm defects. [ABSTRACT FROM AUTHOR]

Power consumption has become one of the primary challenges to meetMoore’s law. For reducing power consumption, single-electron transistor (SET) at room temperature has been demonstrated as a promising device for extending Moore’s law due to its ultralow power consumption in operation. Previous works have proposed automated mapping approaches for SET arrays that focused on minimizing the number of hexagons in the SET arrays. However, the area of an SET array is the product of the bounded height and the bounded width, and the height usually equals the number of inputs in the Boolean function. Consequently, in this paper, we focus on the width minimization to reduce the overall area in the mapping of the SET arrays. Our approach consists of techniques of product term minimization, branch-then-share (BTS)-aware variable reordering, SET array architecture relaxation, and BTS-aware product term reordering. The experimental results on a set of MCNC and IWLS 2005 benchmarks show that the proposed approach saves 45% of width compared with the work by Chiang et al., which focused on hexagon count minimization, and also saves 13% of width compared with the work by Chen et al., which focused on width minimization. [ABSTRACT FROM AUTHOR]

Recently, single-electron transistors (SETs) have been attracting substantial attention and are considered candidate devices for future integrated circuits due to their ultralow power consumption. To realize SETs, a binary decision diagram-based SET array is proposed as a suitable candidate for implementing Boolean circuits. Then, some works started developing computer-aided design techniques for this new architecture. However, most of them focused on the development of mapping techniques. How to verify the mapping results is still an open problem. Thus, in this paper, we address this problem and develop a satisfiability (SAT)-based verification method. We propose a transformation approach to model the functionality of a mapped SET array as a conjunctive normal form formula. Then, the problem that whether the SET array is functionally equivalent to its specification circuit can be solved with a SAT solver. The experimental results show that the proposed method can successfully verify correct and incorrect SET array implementations with reasonable verification time. [ABSTRACT FROM PUBLISHER]