1. Remote Online Two-Step Stress Lifetime Acceleration Test System for Ultraviolet Light-Emitting Diodes
- Author
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Qiu-Wei Zheng, Yulin Gao, Zhong Chen, Yijun Lu, Tingzhu Wu, Ziquan Guo, Lihong Zhu, Yu-Jiao Ruan, Yue Lin, and Weijie Guo
- Subjects
Optical fiber ,Materials science ,business.industry ,Photoelectric effect ,medicine.disease_cause ,law.invention ,Acceleration ,law ,medicine ,Optoelectronics ,Junction temperature ,Electrical and Electronic Engineering ,business ,Instrumentation ,Remote control ,Ultraviolet ,Light-emitting diode ,Diode - Abstract
Ultraviolet light-emitting diodes (UV LEDs) have been widely applied in various fields, such as sewage treatment, sterilization, and disinfection medical treatment. However, the remained problems of UV LEDs mainly concern poor photoelectric stability, low efficiency, safety protection, and among others. In order to evaluate and predict the stability and lifetime of UV LEDs safely and efficiently, a comprehensive UV LEDs two-step aging test system has been designed in this work. Two steps of different temperature stresses with total aging time up to 720 h are applied to UV LEDs. The junction temperature derived from spectroscopy has been taken under consideration during the test to evaluate lifetime accurately. A smartphone-based remote control and test scheme has been developed to monitor and control the online testing and therefore ensure the safety and convenience during the aging experiment. more...
- Published
- 2021
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