1. Microresonator Frequency Reference for Terahertz Precision Sensing and Metrology
- Author
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Rishabh Gandhi, Dominik Walter Vogt, and Rainer Leonhardt
- Subjects
Physics ,Physics - Instrumentation and Detectors ,Radiation ,Spectrometer ,Terahertz radiation ,business.industry ,Frequency drift ,FOS: Physical sciences ,Frequency shift ,Instrumentation and Detectors (physics.ins-det) ,Metrology ,Highly sensitive ,Quality (physics) ,Optics ,Continuous wave ,Electrical and Electronic Engineering ,business ,Optics (physics.optics) ,Physics - Optics - Abstract
Highly sensitive terahertz (THz) sensors for a myriad of applications are rapidly evolving. A widespread sensor concept is based on the detection of minute resonance frequency shifts due to a targeted specimen in the sensors environment. Therefore, cutting-edge high resolution continuous wave (CW) THz spectrometers provide very powerful tools to investigate the sensors' performances. However, unpredictable yet non negligible frequency drifts common to state-of-the-art CW THz spectrometers limit the sensors' accuracy for ultra-high precision sensing and metrology. Here, we overcome this deficiency by introducing an ultra-high quality (Q) THz microresonator frequency reference. Measuring the sensor's frequency shift relative to a well-defined frequency reference eliminates the unwanted frequency drift, and fully exploits the capabilities of modern CW THz spectrometers as well as THz sensors. In a proof-of-concept experiment, we demonstrate the accurate and repeated detection of minute resonance frequency shifts of less than 5MHz at 0.6THz of a THz microresonator sensor.
- Published
- 2022
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