1. High-resolution X-ray luminescence extension imaging
- Author
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Zhigao Yi, Xiaogang Liu, Zhongzhu Hong, Juan Li, Xian Qin, Xiangyu Ou, Yiming Wu, Bolong Huang, Jie Zan, Lili Xie, Qinxia Wu, Huanghao Yang, Hongyu Bian, Xiaofeng Chen, Qiushui Chen, and Xiaorong Song
- Subjects
Multidisciplinary ,Materials science ,Silicon ,business.industry ,Detector ,Resolution (electron density) ,chemistry.chemical_element ,Photodetector ,02 engineering and technology ,Electron ,Radioluminescence ,010402 general chemistry ,021001 nanoscience & nanotechnology ,01 natural sciences ,0104 chemical sciences ,chemistry ,Optoelectronics ,0210 nano-technology ,business ,Luminescence ,Quantum - Abstract
Current X-ray imaging technologies involving flat-panel detectors have difficulty in imaging three-dimensional objects because fabrication of large-area, flexible, silicon-based photodetectors on highly curved surfaces remains a challenge1–3. Here we demonstrate ultralong-lived X-ray trapping for flat-panel-free, high-resolution, three-dimensional imaging using a series of solution-processable, lanthanide-doped nanoscintillators. Corroborated by quantum mechanical simulations of defect formation and electronic structures, our experimental characterizations reveal that slow hopping of trapped electrons due to radiation-triggered anionic migration in host lattices can induce more than 30 days of persistent radioluminescence. We further demonstrate X-ray luminescence extension imaging with resolution greater than 20 line pairs per millimetre and optical memory longer than 15 days. These findings provide insight into mechanisms underlying X-ray energy conversion through enduring electron trapping and offer a paradigm to motivate future research in wearable X-ray detectors for patient-centred radiography and mammography, imaging-guided therapeutics, high-energy physics and deep learning in radiology. Using lanthanide-doped nanomaterials and flexible substrates, an approach that enables flat-panel-free, high-resolution, three-dimensional imaging is demonstrated and termed X-ray luminescence extension imaging.
- Published
- 2021