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Carbon nanotubes (CNTs) are promising candidates for transistors and interconnects for nanoelectronic circuits. Although CNTs intrinsically have excellent electrical conductivity, the large contact resistance at the interface between CNT and metal hinders its practical application. Here, we show that electrical contact to the CNT is substantially improved using a graphitic interfacial layer catalyzed by a Ni layer. The p-type semiconducting CNT with graphitic contact exhibits high on-state conductance at room temperature and a steep subthreshold swing in a back-gate configuration. We also show contact improvement to the semiconducting CNTs with different capping metals. To study the role of the graphitic interfacial layer in the contact stack, the capping metal and Ni catalyst were selectively removed and replaced with new metal pads deposited by evaporation and without further annealing. Good electrical contact to the semiconducting CNTs was still preserved after the new metal replacement, indicating that the contact improvement is attributed to the presence of the graphitic interfacial layer. [ABSTRACT FROM PUBLISHER]

There has been a strong demand for developing an ultradense and low-power nonvolatile memory technology. In this paper, we present a carbon-based resistive random access memory device with a carbon nanotube (CNT) electrode. An amorphous carbon layer is sandwiched between the fast-diffusing top metal electrode and the bottom CNT electrode, exhibiting a bipolar switching behavior. The use of the CNT electrode can substantially reduce the size of the active device area. We also demonstrate a carbon-based complementary resistive switch (CRS) consisting of two back-to-back connected memory cells, providing a route to reduce the sneak current in the cross-point memory. The bit information of the CRS cell is stored in a high-resistance state, thus reducing the power consumption of the CRS memory cell. This paper provides valuable early data on the effect of electrode size scaling down to nanometer size. [ABSTRACT FROM PUBLISHER]

Kinetic inductance is an important property of carbon nanotubes (CNTs) in high-frequency applications. However, disagreements exist in whether the kinetic inductance of CNTs is present in the diffusive transport regime. In this paper, we fabricated the horizontally aligned multiwalled nanotube (MWNT) arrays on silicon substrates and investigated the inductance properties of the MWNT arrays with different lengths using direct current and radio frequency characterizations. The experimental results show that the electron transport in the CNT arrays is diffusive and that the value of the kinetic inductance is proportional to the length of the CNT arrays. We have experimentally validated that the kinetic inductance theory is applicable to CNTs in the diffusive transport regime. This paper could quell the existing disagreements about the kinetic inductance and provide insights to the potential applications of CNTs as interconnects and on-chip inductors. [ABSTRACT FROM AUTHOR]

The electromigration (EM) properties of pure Cu and Cu/carbon nanotube (CNT) composites were studied using the Blech test structure. Pure Cu and Cu/CNT composite segments were subjected to a current density of 1.2 × 106 A/cm2. The average void growth rate of Cu/CNT composite sample was measured to be around four times lower than that of the pure copper sample. The average critical current-density-length threshold products of the pure Cu and Cu/CNT composites were estimated to be 1800 and 5400 A/cm, respectively. The slower EM rate of the CU/CNT composite stripes is attributed to the presence of CNT, which acts as trapping centers and causes a decrease in the diffusion of EM-induced migrating atoms. [ABSTRACT FROM AUTHOR]