1. Oxygen K-edge X-ray absorption spectra of liquids with minimization of window contamination
- Author
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Peter Hillman, Linda I. Vogt, Julien J. H. Cotelesage, Simon J. George, Charles J. Titus, Graham N. George, Albert Eugene Butterfield, Samin Sharifi, and Ingrid J. Pickering
- Subjects
Nuclear and High Energy Physics ,Materials science ,Absorption spectroscopy ,Analytical chemistry ,chemistry.chemical_element ,02 engineering and technology ,Nitride ,engineering.material ,010402 general chemistry ,01 natural sciences ,Oxygen ,chemistry.chemical_compound ,Instrumentation ,Radiation ,X-Rays ,X-ray ,Diamond ,Contamination ,021001 nanoscience & nanotechnology ,0104 chemical sciences ,Radiography ,X-Ray Absorption Spectroscopy ,K-edge ,Silicon nitride ,chemistry ,engineering ,0210 nano-technology - Abstract
Oxygen K-edge X-ray absorption spectroscopy is used routinely to study a range of solid materials. However, liquid samples are studied less frequently at the oxygen K-edge due to the combined challenges of high-vacuum conditions and oxygen contamination of window materials. A modular sample holder design with a twist-seal sample containment system that provides a simple method to encapsulate liquid samples under high-vacuum conditions is presented. This work shows that pure silicon nitride windows have lower oxygen contamination than both diamond- and silicon-rich nitride windows, that the levels of oxygen contamination are related to the age of the windows, and provides a protocol for minimizing the background oxygen contamination. Acid-washed 100 nm-thick silicon nitride windows were found to give good quality oxygen K-edge data on dilute liquid samples.
- Published
- 2021