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Classification is an important task in various areas. In many real-world applications, class imbalance and overlapping problems have been reported as major issues in the application of traditional classification algorithms. An imbalance problem occurs when training data contain considerably more representatives of one class than of other classes. Class overlap occurs when a region in the data space contains a similar number of data for each class. When a class overlap occurs in imbalanced data sets, classification becomes even more complicated. Although various approaches have been proposed to deal separately with class imbalance and overlapping problems, only a few studies have attempted to address both problems simultaneously. In this paper, we propose an overlap-sensitive margin (OSM) classifier based on a modified fuzzy support vector machine and k -nearest neighbor algorithm to address imbalanced and overlapping data sets. The main idea of the proposed OSM classifier is to separate the data space into soft- and hard-overlap regions using the modified fuzzy support vector machine algorithm. The separated spaces are then classified using the decision boundaries of the support vector machine and 1-nearest neighbor algorithms. Furthermore, by separating a data set into soft- and hard-overlap regions, one can determine which part of the data is to be examined more closely for classification in real-world situations. Experiments using synthetic and real-world data sets demonstrated that the proposed OSM classifier outperformed existing methods for imbalanced and overlapping situations. [ABSTRACT FROM AUTHOR]

Defect patterns exhibited in wafer bin maps (WBMs) can provide essential clues about critical process failures to field engineers. In modern manufacturing processes, the automatic WBM defect pattern classification is critical for yield improvement. Although it is difficult to collect sufficient labels while a lot of unlabeled data is given, most existing studies have mainly used only labeled WBM data. Moreover, the unlabeled out-of-distribution (OOD) WBMs are inevitably collected. It degrades the performance of semi-supervised models. To this end, we propose a method for safe wafer bin map classification with self-supervised contrastive learning (SWaCo) to effectively exploit the unlabeled data with OOD. We propose a loss function to utilize label information in the pre-training step to learn more suitable representations for the downstream WBM classification task. The negative labeled examples of the same class as the anchor are used for additional positive examples. Moreover, we investigate proper data augmentation for WBM self-supervised contrastive learning. To evaluate the performance and the applicability of the proposed method, experiments are conducted on a public benchmark WBM dataset, WM-811K. The results demonstrate that the proposed method achieves better classification accuracy than existing methods, especially when only a small amount of class information is given. [ABSTRACT FROM AUTHOR]

Relevant statistical modeling and analysis of dental data can improve diagnostic and treatment procedures. The purpose of this study is to demonstrate the use of various data mining algorithms to characterize patients with dentofacial deformities. A total of 72 patients with skeletal malocclusions who had completed orthodontic and orthognathic surgical treatments were examined. Each patient was characterized by 22 measurements related to dentofacial deformities. Clustering analysis and visualization grouped the patients into three different patterns of dentofacial deformities. A feature selection approach based on a false discovery rate was used to identify a subset of 22 measurements important in categorizing these three clusters. Finally, classification was performed to evaluate the quality of the measurements selected by the feature selection approach. The results showed that feature selection improved classification accuracy while simultaneously determining which measurements were relevant. [ABSTRACT FROM AUTHOR]

Abstract: The main purpose of this study is to develop an effective classification procedure that discriminates between normal spectra and cancerous spectra in near infrared (NIR) spectroscopic data in which the classes are highly imbalanced and overlapped. Our proposed procedure consists of several steps. First, to ensure the comparability between spectra, normalization was done by dividing each spectral point by the area of the total intensity of the spectrum. Second, clustering analysis was performed with these normalized spectra to separate the spectra that represent the normal pattern from a mixed group that contains both normal and tumor spectra. Third, we conducted two-stage classification, the first being an effort to construct a classification model with the labels obtained from the preceding clustering analysis and the second being a classification to focus on the mixed group classified from the first classification model. To increase the accuracy, the second classification model was constructed based on the selected features that capture important characteristics of the spectral data. Our proposed procedure was evaluated by its classification ability in testing samples using a leave-one-out cross validation technique, yielding acceptable classification accuracy. [Copyright &y& Elsevier]

In the semiconductor manufacturing processes, a wafer bin map (WBM) represents electrical test results. In WBMs, defective dies often form specific local patterns; such patterns are usually caused by failure from specific processes or equipment. Thus, identifying the local patterns is crucial for finding the processes or equipment responsible for the fault. Various statistical and machine learning methods have been developed for WBM classification; however, most of the existing studies considered single WBMs. This study proposes an explainable neural network for multiple WBMs classification, named a hierarchical spatial-test attention network. Our method has a hierarchical structure that reflects the characteristics of multiple WBMs. The method has two levels of attention mechanisms to the spatial and test levels, allowing the model to attend to more and less important parts when classifying WBMs. Furthermore, we propose a spatial attention probability conveyance mechanism and test-level attention entropy penalty to improve the classification performance and interpretability of the proposed method. We applied our method on a real-world multiple WBMs dataset to demonstrate the usefulness and applicability of our method. The results confirmed that the proposed method could accurately classify defect patterns while correctly identifying defect patterns’ test and location. [ABSTRACT FROM AUTHOR]

Player evaluation is a key component of the question-answering (QA) system in sports. Since existing player evaluation methods heavily rely on game statistics, they cannot capture the qualitative impact of each player during a game, which can be exploited using news articles after the game. In this paper, we propose a deep learning-based player evaluation model by combining both quantitative game statistics and the qualitative analyses provided by news articles. Players are classified as positive or negative based on their performance during certain periods, and news articles in the same period are annotated using the player's class. Then, the relationship between news articles and the annotated polarity is investigated by a deep neural network, which can deal with the high dimensionality of the text data. Since there is no explicit polarity label for news articles, we use the change in game statistics in target periods to annotate related sentences. The proposed system is applied to a Korean professional baseball league (KBO) and it is shown to be capable of understanding the sentence polarity of news articles on player performances. [ABSTRACT FROM AUTHOR]