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A new low‐power and high‐speed multiplier is presented based on the voltage over scaling (VOS) technique and new 5:3 and 7:3 counter cells. The VOS reduces power consumption in digital circuits, but different voltage levels of the VOS increase the delay in different stages of a multiplier. Hence, the proposed counters are implemented by the gate‐diffusion input technique to solve the speed limitation of the VOS‐based circuits. The proposed GDI‐based 5:3 and 7:3 counters save power and reduce the area by 2x and 2.5x, respectively. To prevent the threshold voltage (Vth) drop in the suggested GDI‐based circuits, carbon nanotube field‐effect transistor (CNTFET) technology is used. In the counters, the chirality vector and tubes of the CNTFETs are properly adjusted to attain full‐swing outputs with high driving capability. Also, their validation against heat distribution under different time intervals, as a major issue in the CNTFET technology is investigated, and their very low sensitivity is confirmed. The low complexity, high stability and efficient performance of the presented counter cells introduce the proposed VOS‐CNTFET‐GDI‐based multiplier as an alternative to the previous designs. [ABSTRACT FROM AUTHOR]

Summary: The performance of the programmable integrated circuits (ICs) like digital signal processors (DSPs), central processing units (CPUs), and microcontrollers is highly dependent on the magnitude comparators. This article presents a new reliable and efficient 1‐bit comparator based on carbon nanotube field‐effect transistors (CNTFETs) technology. The gate diffusion input (GDI) technique is used to reduce the number of transistors. Also, single swing restoration (SR) transistors and transmission gate (TG) techniques are combined to attain full‐swing outputs with high driving capability. The low internal capacitances and the fewer number of internal nodes of the proposed comparator make it low‐power both in single‐bit and multibit (2‐bit, 4‐bit, 8‐bit, and 16‐bit) implementations. Variations analyses of the circuit and technology parameters are performed that show the cell efficiency. From the layout results, the 1‐bit and 16‐bit comparators occupy 0.1944 μm2 and 37.485 μm2 as the total die area, respectively. The proposed circuit is implemented in image processing in which the best performance compared with state‐of‐the‐art designs regarding hardware complexity, circuitry performance, and image quality assessments are confirmed, by at least 50% improvements of different critical parameters. The resulted figure of merits nominates the cell for future ICs. [ABSTRACT FROM AUTHOR]