6 results on '"Haendler, S."'
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2. Characterization and modeling of low frequency noise in CMOS inverters
3. Low-Frequency Noise Investigation and Noise Variability Analysis in High- k/Metal Gate 32-nm CMOS Transistors.
4. Impact of Source–Drain Series Resistance on Drain Current Mismatch in Advanced Fully Depleted SOI n-MOSFETs.
5. Impact of low-frequency noise variability on statistical parameter extraction in ultra-scaled CMOS devices.
6. Impact of dynamic variability on the operation of CMOS inverter.
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