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7 results on '"Holman, W. Timothy"'

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1. Angular Effects on Single-Event Mechanisms in Bulk FinFET Technologies.

2. A New Error Correction Circuit for Delay Locked Loops.

3. The Quad-Path Hardening Technique for Switched-Capacitor Circuits.

4. Effect of Negative Bias Temperature Instability on the Single Event Upset Response of 40 nm Flip-Flops.

5. Impact of Well Structure on Single-Event Well Potential Modulation in Bulk CMOS.

6. Effect of Transistor Density and Charge Sharing on Single-Event Transients in 90-nm Bulk CMOS.

7. Effects of Guard Bands and Well Contacts in Mitigating Long SETs in Advanced CMOS Processes.

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