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Raman phonon differential spectrometrics (DPS) and contact angle measurements resolved that solvation of the NaX (X = HSO 4 , NO 3 , ClO 4 , SCN) complex salts stiffens the H O stretching phonon from 3200 to ~ 3500 cm − 1 and softens the O:H nonbond phonon from 180 to ~ 70 cm − 1 with rising of solution surface stress. The solute capability of bond transition in terms of the fraction coefficient, follows the relation, f NaX (C) ∝ 1-exp(− C/C 0 ) towards saturation, with C being the solute concentration and C 0 the decay constant. Observations evidence that: (i) the solute ionic field electrification aligns, stretches, and polarizes its neighboring H 2 O molecules, which shortens the H O bond but lengthens the O:H nonbond via O O Coulomb repulsion; (ii) the effect of X − electrification on the O:H O bond relaxation varies with solute type and solute concentration. Exercises not only verify the essentiality of solvent O:H O bond cooperative relaxation and polarization but also demonstrate the power of DPS that resolves processes occurred upon solvation. [ABSTRACT FROM AUTHOR]