1. Nanoscale Characterization of Graphene Oxide-Based Epoxy Nanocomposite Using Inverted Scanning Microwave Microscopy.
- Author
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Joseph, C. H., Luzi, Francesca, Azman, S. N. Afifa, Forcellese, Pietro, Pavoni, Eleonora, Fabi, Gianluca, Mencarelli, Davide, Gentili, Serena, Pierantoni, Luca, Morini, Antonio, Simoncini, Michela, Bellezze, Tiziano, Corinaldesi, Valeria, and Farina, Marco
- Subjects
NEAR-field microscopy ,COMPUTATIONAL electromagnetics ,GRAPHENE ,NANOCOMPOSITE materials ,MICROWAVES - Abstract
Scanning microwave microscopy (SMM) is a novel metrological tool that advances the quantitative, nanometric, high-frequency, electrical characterization of a broad range of materials of technological importance. In this work, we report an inverted near-field scanning microwave microscopy (iSMM) investigation of a graphene oxide-based epoxy nanocomposite material at a nanoscopic level. The high-resolution spatial mapping of local conductance provides a quantitative analysis of the sample's electrical properties. In particular, the electrical conductivity in the order of ∼ 10 − 1 S/m as well as the mapping of the dielectric constant with a value of ∼4.7 ± 0.2 are reported and validated by the full-wave electromagnetic modeling of the tip–sample interaction. [ABSTRACT FROM AUTHOR]
- Published
- 2022
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