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Growing exploitation of Machine Learning (ML) in safety-critical applications necessitates rigorous safety analysis. Hardware reliability assessment is a major concern with respect to measuring the level of safety. Quantifying the reliability of emerging ML models, including Deep Neural Networks (DNNs), is highly complex due to their enormous size in terms of the number of parameters and computations. Conventionally, Fault Injection (FI) is applied to perform a reliability measurement. However, performing FI on modern-day DNNs is prohibitively time-consuming if an acceptable confidence level is to be achieved. In order to speed up FI for large DNNs, statistical FI has been proposed. However, the run-time for the large DNN models is still considerably long. In this work, we introduce DeepVigor+, a scalable, fast and accurate semi-analytical method as an efficient alternative for reliability measurement in DNNs. DeepVigor+ implements a fault propagation analysis model and attempts to acquire Vulnerability Factors (VFs) as reliability metrics in an optimal way. The results indicate that DeepVigor+ obtains VFs for DNN models with an error less than 1\% and 14.9 up to 26.9 times fewer simulations than the best-known state-of-the-art statistical FI enabling an accurate reliability analysis for emerging DNNs within a few minutes., Comment: 14 pages, 9 figures, 8 tables, 16 equations. The source code is accessible via: https://github.com/mhahmadilivany/DeepVigor

Systolic array has emerged as a prominent architecture for Deep Neural Network (DNN) hardware accelerators, providing high-throughput and low-latency performance essential for deploying DNNs across diverse applications. However, when used in safety-critical applications, reliability assessment is mandatory to guarantee the correct behavior of DNN accelerators. While fault injection stands out as a well-established practical and robust method for reliability assessment, it is still a very time-consuming process. This paper addresses the time efficiency issue by introducing a novel hierarchical software-based hardware-aware fault injection strategy tailored for systolic array-based DNN accelerators.

In this paper, we propose an architecture of a novel adaptive fault-tolerant approximate multiplier tailored for ASIC-based DNN accelerators.

The superior performance of Deep Neural Networks (DNNs) has led to their application in various aspects of human life. Safety-critical applications are no exception and impose rigorous reliability requirements on DNNs. Quantized Neural Networks (QNNs) have emerged to tackle the complexity of DNN accelerators, however, they are more prone to reliability issues. In this paper, a recent analytical resilience assessment method is adapted for QNNs to identify critical neurons based on a Neuron Vulnerability Factor (NVF). Thereafter, a novel method for splitting the critical neurons is proposed that enables the design of a Lightweight Correction Unit (LCU) in the accelerator without redesigning its computational part. The method is validated by experiments on different QNNs and datasets. The results demonstrate that the proposed method for correcting the faults has a twice smaller overhead than a selective Triple Modular Redundancy (TMR) while achieving a similar level of fault resiliency., Comment: 5 pages, 4 figures, 1 table. The paper is accepted at the AICAS'23 conference

Deep Learning, and in particular, Deep Neural Network (DNN) is nowadays widely used in many scenarios, including safety-critical applications such as autonomous driving. In this context, besides energy efficiency and performance, reliability plays a crucial role since a system failure can jeopardize human life. As with any other device, the reliability of hardware architectures running DNNs has to be evaluated, usually through costly fault injection campaigns. This paper explores the approximation and fault resiliency of DNN accelerators. We propose to use approximate (AxC) arithmetic circuits to agilely emulate errors in hardware without performing fault injection on the DNN. To allow fast evaluation of AxC DNN, we developed an efficient GPU-based simulation framework. Further, we propose a fine-grain analysis of fault resiliency by examining fault propagation and masking in networks, Comment: 10 pages, 6 tables, 9 figures

Nowadays, the extensive exploitation of Deep Neural Networks (DNNs) in safety-critical applications raises new reliability concerns. In practice, methods for fault injection by emulation in hardware are efficient and widely used to study the resilience of DNN architectures for mitigating reliability issues already at the early design stages. However, the state-of-the-art methods for fault injection by emulation incur a spectrum of time-, design- and control-complexity problems. To overcome these issues, a novel resiliency assessment method called APPRAISER is proposed that applies functional approximation for a non-conventional purpose and employs approximate computing errors for its interest. By adopting this concept in the resiliency assessment domain, APPRAISER provides thousands of times speed-up in the assessment process, while keeping high accuracy of the analysis. In this paper, APPRAISER is validated by comparing it with state-of-the-art approaches for fault injection by emulation in FPGA. By this, the feasibility of the idea is demonstrated, and a new perspective in resiliency evaluation for DNNs is opened., Comment: 5 pages, 2 tables, 6 figures

Artificial Intelligence (AI) and, in particular, Machine Learning (ML) have emerged to be utilized in various applications due to their capability to learn how to solve complex problems. Over the last decade, rapid advances in ML have presented Deep Neural Networks (DNNs) consisting of a large number of neurons and layers. DNN Hardware Accelerators (DHAs) are leveraged to deploy DNNs in the target applications. Safety-critical applications, where hardware faults/errors would result in catastrophic consequences, also benefit from DHAs. Therefore, the reliability of DNNs is an essential subject of research. In recent years, several studies have been published accordingly to assess the reliability of DNNs. In this regard, various reliability assessment methods have been proposed on a variety of platforms and applications. Hence, there is a need to summarize the state of the art to identify the gaps in the study of the reliability of DNNs. In this work, we conduct a Systematic Literature Review (SLR) on the reliability assessment methods of DNNs to collect relevant research works as much as possible, present a categorization of them, and address the open challenges. Through this SLR, three kinds of methods for reliability assessment of DNNs are identified including Fault Injection (FI), Analytical, and Hybrid methods. Since the majority of works assess the DNN reliability by FI, we characterize different approaches and platforms of the FI method comprehensively. Moreover, Analytical and Hybrid methods are propounded. Thus, different reliability assessment methods for DNNs have been elaborated on their conducted DNN platforms and reliability evaluation metrics. Finally, we highlight the advantages and disadvantages of the identified methods and address the open challenges in the research area., Comment: 42 pages, 15 figures, 3 tables, 201 references. The paper has been reviewed and revised 2 times and is under the 3rd review

While the role of Deep Neural Networks (DNNs) in a wide range of safety-critical applications is expanding, emerging DNNs experience massive growth in terms of computation power. It raises the necessity of improving the reliability of DNN accelerators yet reducing the computational burden on the hardware platforms, i.e. reducing the energy consumption and execution time as well as increasing the efficiency of DNN accelerators. Therefore, the trade-off between hardware performance, i.e. area, power and delay, and the reliability of the DNN accelerator implementation becomes critical and requires tools for analysis. In this paper, we propose a framework DeepAxe for design space exploration for FPGA-based implementation of DNNs by considering the trilateral impact of applying functional approximation on accuracy, reliability and hardware performance. The framework enables selective approximation of reliability-critical DNNs, providing a set of Pareto-optimal DNN implementation design space points for the target resource utilization requirements. The design flow starts with a pre-trained network in Keras, uses an innovative high-level synthesis environment DeepHLS and results in a set of Pareto-optimal design space points as a guide for the designer. The framework is demonstrated in a case study of custom and state-of-the-art DNNs and datasets., Comment: This paper is accepted at the 24th International Symposium on Quality Electronic Design (ISQED) 2023, 8 pages, 4 figures, 4 tables

Deep Neural Networks (DNNs) and their accelerators are being deployed ever more frequently in safety-critical applications leading to increasing reliability concerns. A traditional and accurate method for assessing DNNs' reliability has been resorting to fault injection, which, however, suffers from prohibitive time complexity. While analytical and hybrid fault injection-/analytical-based methods have been proposed, they are either inaccurate or specific to particular accelerator architectures. In this work, we propose a novel accurate, fine-grain, metric-oriented, and accelerator-agnostic method called DeepVigor that provides vulnerability value ranges for DNN neurons' outputs. An outcome of DeepVigor is an analytical model representing vulnerable and non-vulnerable ranges for each neuron that can be exploited to develop different techniques for improving DNNs' reliability. Moreover, DeepVigor provides reliability assessment metrics based on vulnerability factors for bits, neurons, and layers using the vulnerability ranges. The proposed method is not only faster than fault injection but also provides extensive and accurate information about the reliability of DNNs, independent from the accelerator. The experimental evaluations in the paper indicate that the proposed vulnerability ranges are 99.9% to 100% accurate even when evaluated on previously unseen test data. Also, it is shown that the obtained vulnerability factors represent the criticality of bits, neurons, and layers proficiently. DeepVigor is implemented in the PyTorch framework and validated on complex DNN benchmarks., Comment: 6 pages, 6 figures, 2 tables, accepted at ETS 2023 (cas.polito.it/ETS23/#/program-conference#tab-accepted)

Along with the complexity of electronic systems for safety-critical applications, the cost of safety mechanisms evaluation by fault injection simulation is rapidly going up. To reduce these efforts, we propose a fault injection methodology where Hardware Description Language (HDL) code slicing is exploited to accelerate transient fault injection campaigns by pruning fault lists and reducing the number of the injections. In particular, the dynamic HDL slicing technique provides for a critical fault list and allows avoiding injections at non-critical time-steps. Experimental results on an industrial core show that the proposed methodology can successfully reduce the number of injections by up to 10 percent and speed-up the fault injection campaigns.

This work proposes a fault injection methodology where Hardware Description Language (HDL) code slicing is exploited to prune fault injection locations, thus enabling more efficient campaigns for safety mechanisms evaluation. In particular, the dynamic HDL slicing technique provides for a highly collapsed critical fault list and allows avoiding injections at redundant locations or time-steps. Experimental results show that the proposed methodology integrated into commercial tool flow doubles the simulation speed when comparing to the state-of-the-art industrial-grade EDA tool flows., Comment: arXiv admin note: substantial text overlap with arXiv:2001.09982

Recent safety standards set stringent requirements for the target fault coverage in embedded microprocessors, with the objective to guarantee robustness and functional safety of the critical electronic systems. This motivates the need for improving the quality of test generation for microprocessors. A new high-level implementation-independent test generation method for RISC processors is proposed. The set of instructions of the processor is partitioned nto groups. For each group, a dedicated test template is created, to be used for generating two test programs, for testing the control and the data paths respectively. For testing the control part, a novel high-level control fault model is proposed. Using this model, a set of deterministic test data operands are generated for each instruction of the given group. The advantage of the high-level fault model is that it covers larger than SAF fault class including multiple fault coverage in the control part. For generating the data path test, pseudoexhaustive data operands are used. We investigated the feasibility of the approach and demonstrated high efficiency of the generated test programs for testing the execute module of the miniMIPS RISC processor., Comment: 2019 IEEE European Test Symposium (ETS). arXiv admin note: text overlap with arXiv:1907.12325

Trends in advanced electronic systems' design have a notable impact on design verification technologies. The recent paradigms of Internet-of-Things (IoT) and Cyber-Physical Systems (CPS) assume devices immersed in physical environments, significantly constrained in resources and expected to provide levels of security, privacy, reliability, performance and low power features. In recent years, numerous extra-functional aspects of electronic systems were brought to the front and imply verification of hardware design models in multidimensional space along with the functional concerns of the target system. However, different from the software domain such a holistic approach remains underdeveloped. The contributions of this paper are a taxonomy for multidimensional hardware verification aspects, a state-of-the-art survey of related research works and trends towards the multidimensional verification concept. The concept is motivated by an example for the functional and power verification dimensions., Comment: 2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)

A new high-level implementation independent functional fault model for control faults in microprocessors is introduced. The fault model is based on the instruction set, and is specified as a set of data constraints to be satisfied by test data generation. We show that the high-level test, which satisfies these data constraints, will be sufficient to guarantee the detection of all non-redundant low level faults. The paper proposes a simple and fast simulation based method of generating test data, which satisfy the constraints prescribed by the proposed fault model, and a method of evaluating the high-level control fault coverage for the proposed fault model and for the given test. A method is presented for identification of the high-level redundant faults, and it is shown that a test, which provides 100% coverage of non-redundant high-level faults, will also guarantee 100% non-redundant SAF coverage, whereas all gate-level SAF not covered by the test are identified as redundant. Experimental results of test generation for the execution part of a microprocessor support the results presented in the paper., Comment: 2019 IEEE Latin American Test Symposium (LATS)