Search

In this study, MnZn ferrites with added YIG nanoparticles were developed for MHz frequency applications. The effect of the magnetic YIG additive on the power loss, initial permeability, and cutoff frequency of MnZn ferrites was investigated. A small quantity of added YIG effectively reduces the power loss and concurrently increases the initial permeability. Compared to the results for the MnZn ferrite with no added YIG, the optimal MnZn ferrite with 600 ppm added YIG exhibits a reduction in the power loss at 25°C of 56.4% and 36.6% at 1 MHz/50 mT and 3 MHz/10 mT, respectively, and a 13.9% increase in the initial permeability. This sample also exhibits a good stability of the power loss against temperature. The power loss remains below 205 kW/m3 over temperatures ranging from 25 to 140°C. The effect mechanism of YIG addition on the magnetic properties of MnZn ferrites was studied. An analysis based on the equivalent circuit model showed that the reduction in the eddy current loss and power loss mainly results from the increase in the grain boundary resistance caused by the addition of highly resistive YIG. [ABSTRACT FROM AUTHOR]

In this work, the low-power-loss Mn–Zn ferrite was prepared by the traditional ceramic sintering process. This sample shows the good wide-temperature stability of power loss (P cv). In the whole measurement temperature range of 25 - 120 °C, P cv s maintain less than 100, 682, and 1455 kW/m3 at 100 kHz/100 mT, 500 kHz/100 mT and 800 kHz/100 mT, respectively. The effect of uniaxial compressive stress on power loss at 100, 500 and 800 kHz was investigated. Stress has greater impact on P cv at high frequencies and P cv increases remarkably. To clarify the mechanism of stress on power loss, P cv was divided into three parts including hysteresis loss (P hv), eddy current loss (P ev) and residual loss (P rv), and the effect of stress on each part of loss was discussed. At the low frequency of 100 kHz, P cv is mainly contributed by P hv. The applied stress leads the local anisotropic stress and makes domain wall displacement more difficult, which is the reason of the increase of P hv. When frequency increases to 500 and 800 kHz, P ev and P rv become more important. The compressive stress is in favour of electron transfer between Fe3+ and Fe2+ in grains and electron tunnelling effect at grain boundaries, which leads to the decrease of resistivity. This is the origin of enhanced P ev under the compressive stress. The enhanced P rv is related to the enhanced electronic diffusion under the compressive stress. The clarification of the mechanism of stress on power loss is beneficial to develop new soft ferrite materials with low stress sensitivity for high-frequency applications. [ABSTRACT FROM AUTHOR]

• The new Mn ferrite with low power loss at high frequencies of 1–3 MHz over a wide temperature range of 25–140 °C was successfully developed. • Power loss was divided into hysteresis loss (P hv), eddy current loss (P ev) and residual loss (P rv), and the effect of Ta 2 O 5 on each part of power loss at high frequencies was investigated. • Small content of Ta 2 O 5 segregates at grain boundaries and reduces P hv , P ev and P rv. • The mechanism of reduction of P hv , P ev and P rv by the Ta 2 O 5 addition was clarified. Dramatic increase of power loss in the MHz frequency range is the bottleneck problem for MnZn ferrites to be applied in high-frequency power electronic devices. In this work, manganese ferrites with low power loss in the frequency range of 1–3 MHz have been developed by the addition of Ta 2 O 5. The manganese ferrite with 300 ppm Ta 2 O 5 exhibits excellent P cv performance. P cv at 25 °C is as low as 41, 94 and 164 kW/m3 under measurement conditions of 1 MHz/50 mT, 2 MHz/50 mT and 3 MHz/30 mT, respectively. Excellent temperature stability of power loss in the temperature range of 25–140 °C is also achieved in this sample. Power loss was divided to three parts of hysteresis loss, eddy current loss and residual loss. Ta 2 O 5 segregates at grain boundaries and reduces all three parts of loss. The mechanism of Ta 2 O 5 influence on each part of loss has been clarified. [ABSTRACT FROM AUTHOR]