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X-ray polarization-splitting crystals separate incident x rays into two components with perpendicular polarization by Bragg reflections at 45° from paired sets of internal planes. Here, the polarization-splitting properties of a germanium crystal are verified using incompletely polarized synchrotron radiation. Cleaner data would have come from a beam with a higher degree of polarization, which is achievable with small changes in the experimental geometry. [ABSTRACT FROM AUTHOR]

The single-crystal spectropolarimeter envisioned by Baronova and Stepanenko splits an incident x-ray beam into two beams with mutually orthogonal linear polarizations by using simultaneous reflections at the perfectly polarizing 45° Bragg angle on certain pairs of internal planes in hexagonal or cubic crystals. These planes intersect along a threefold symmetry axis, making a 120° angle with each other, and are typically symmetric with respect to the crystal surface. In practice, the wavelength of the diagnostic x-ray lines does not exactly satisfy Bragg's law for the crystal in the ideal polarizing orientation, so the extinction of reflections is incomplete. Accepting this limitation, this paper shows that for cubic crystals, other pairs of internal planes exist that satisfy the polarization requirements approximately. Typically, they are accessible from the perfect polarization-splitting geometry by small rotations of the crystal. This paper includes examples of such planes for cubic crystals with {110} and {211} surface cuts. [ABSTRACT FROM AUTHOR]

The soft x-ray Opacity Spectrometer (OpSpec) used on the National Ignition Facility (NIF) has recently incorporated an elliptically shaped crystal. The original OpSpec used two convex cylindrical crystals for time-integrated measurements of point-projection spectra from 540 to 2100 eV. However, with the convex geometry, the low-energy portion of the spectrum suffered from high backgrounds due to scattered x-rays as well as reflections from alternate crystal planes. An elliptically shaped crystal allows an acceptance aperture at the crossover focus between the crystal and the detector, which reduces background and eliminates nearly all reflections from alternate crystal planes. The current elliptical design is an improvement from the convex cylindrical design but has a usable energy range from 900 to 2100 eV. In addition, OpSpec is currently used on 18 NIF shots/year, in which both crystals are typically damaged beyond reuse, so efficient production of 36 crystals/year is required. Design efforts to improve the existing system focus on mounting reliability, reducing crystal strain to increase survivability between mounting and shot time, and extending the energy range of the instrument down to 520 eV. The elliptical design, results, and future options are presented. [ABSTRACT FROM AUTHOR]

Hexagonal and cubic crystals contain paired sets of internal planes that reflect the linearly polarized components of certain x rays into two separate, perpendicular directions. For the cubic crystals, two distinct crystal orientations provide the same polarization-splitting geometry. One of the orientations may have advantages for plasma spectroscopy by suppressing unwanted reflections. This paper demonstrates the two orientations with a germanium crystal and K characteristic lines from copper and zirconium. [ABSTRACT FROM AUTHOR]

A recently developed single-crystal x-ray spectropolarimeter has been used to record paired sets of polarization-dependent and axially resolved x-ray spectra emitted by wire array z-pinches. In this measurement, two internal planes inside a suitable crystal diffract the x-rays into two perpendicular directions that are normal to each other, thereby separating incident x-rays into their linearly polarized components. This paper gives considerations for fielding the instrument on extended sources. Results from extended sources are difficult to interpret because generally the incident x-rays are not separated properly by the crystal. This difficulty is mitigated by using a series of collimating slits to select incident x-rays that propagate in a plane of symmetry between the polarization-splitting planes. The resulting instrument and some of the spatially resolved polarized x-ray spectra recorded for a 1-MA aluminum wire array z-pinch at the Nevada Terawatt Facility at the University of Nevada, Reno will be presented. [ABSTRACT FROM AUTHOR]