14 results on '"Simons, David"'
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2. Gibbsian Segregation During the Depth Profiling of Copper in Silicon
3. Sputter Depth Profiles in an Al-Cr Multilayer Sample
4. Dynamic Range Consideration for Digital Secondary Ion Image Depth Profiling
5. Metallurgical Applications of SIMS
6. Depth Profiling of Dopants in Aluminum Gallium Arsenide
7. Depth Resolution in Profiling of Thin GaAs-GaAlAs Layers
8. The Effect of Temperature on Beam-Induced Broadening in SIMS Depth Profiling
9. Sputter-Induced Segregation of As in Si During SIMS Depth Profiling
10. High-Accuracy Depth Profiling in Silicon to Refine SUPREM-III Coefficients for B, P, and As
11. Characterization of Silicides by the Energy Distribution of Molecular Ions
12. Digital Slit Imaging for High-Resolution SIMS Depth Profiling
13. On-Line Ion Implantation: The SIMS Primary Ion Beam for Creation of Empirical Quantification Standards
14. Application of SIMS Technique to Industrially Used Organic Materials
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