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This article introduces a spatial angle measuring device based on ensemble diamond nitrogen–vacancy (NV) center optical detection magnetic resonance (ODMR). This device realizes solid-state all-optical wide-field vector magnetic field measurements for solving the angles of magnetic components in space. The system uses diamond NV center magnetic microscope imaging to obtain magnetic vector distribution and calculates the spatial angles of magnetic components based on the magnetic vector distribution. Utilizing magnetism for angle measuring enables non-contact measuring, reduces the impact on the object being measured, and ensures measurement precision and accuracy. Finally, the accuracy of the system is verified by comparing the measurement results with the set values of the angle displacement platform. The results show that the measurement error of the yaw angle of the system is 1°, and the pitch angle and roll angle are 1.5°. The experimental results are in good agreement with the expected results. [ABSTRACT FROM AUTHOR]

Microwave chips dependent devices constitute the cornerstone of many classical and emerging quantum technologies. To meet the demand for high-resolution, lossless, and fast wide-field imaging of microwave devices, we propose a wide-field microwave imaging method based on diamond nitrogen-vacancy center ensembles by combining continuous wave optically detected magnetic resonance technology with optical wide-field imaging technology. First, the optimal selection of laser parameters is achieved by measuring different laser powers. Then the accuracy of the wide-field microwave imaging technique is demonstrated by measuring the near-field imaging of the antenna surface at different microwave input powers and different microwave input frequencies. The spatial resolution of the imaging system is 5 μm over a field of view of 2400 μm × 1350 μm, and the optimal microwave precision measurement sensitivity is 5.6 μT / Hz1/2. The above results are expected to provide a practical reference for applications such as fault diagnosis of highly integrated microwave circuits, antenna radiation profiling, and electro magnetic compatibility testing of integrated microwave circuits. [ABSTRACT FROM AUTHOR]