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Your search keyword '"Thick films -- Properties"' showing total 1 results
Start Over Descriptor "Thick films -- Properties" Topic dielectrics -- properties
1 results on '"Thick films -- Properties"'

1. Dielectric properties of (100) textured thick Pb(Zr(sub x)Ti(sub 1-x))O(sub 3) films with different Zr/Ti atom ratios

Author

Jinrong Cheng, Wenyi Zhu, Nan Li, and Cross, L. Eric

Subjects
Scanning microscopy -- Analysis, Dielectrics -- Analysis, Dielectrics -- Properties, Thick films -- Analysis, Thick films -- Properties, Physics
Abstract

The 2-methoxyethanol based sol-gel spin-on techniques with a special thermal treatment process are used to cover the Pb(Zr(sub x)Ti(sub 1-x))O(sub 3) (PZT) films with Zr/Ti ratios of 60/40, 52/48, and 45/55 onto platinized silicon substrates. The scanning electron microscopy observations show the columnar growth of grains, and the analysis of x-ray diffraction data indicates that all PZT films exhibit (100) texture.

Published
2002

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