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Exposure of polymethylmethacrylate (PMMA) during electron beam lithography (EBL) produces small polymer fragments that dissolve rapidly during the development process. The resist dissolution behavior varies greatly depending on the nature of the developer (solvent) and therefore influences the selection of the EBL parameters, such as dose (sensitivity). A molecular scale examination of the development process is necessary to elucidate the resist–developer interaction mechanisms. In this work, the authors investigate the interaction of short PMMA chains (containing up to 10 MMA units) with common developer components methyl isobutyl ketone (MIBK) and isopropyl alcohol (IPA). For this purpose, the authors conduct molecular dynamics simulations using the Accelrys Materials Studio package. The simulation results were used to characterize the mixtures in the spirit of the Flory–Huggins theory of polymers and also to extract the diffusivities. The authors found that the behavior of PMMA fragments differed considerably in MIBK as compared with IPA. PMMA fragments containing more than three monomers exhibit stronger attractive interaction with MIBK. For all fragment sizes simulated, the diffusivity of PMMA fragments is 60–160% higher in MIBK as well. Similarly, the authors observed differences in the gyration radii. The authors conclude that the kinetic factor seems to be more significant as compared to affinity factor when accounting for differences in exposure sensitivities due to developer selection.Exposure of polymethylmethacrylate (PMMA) during electron beam lithography (EBL) produces small polymer fragments that dissolve rapidly during the development process. The resist dissolution behavior varies greatly depending on the nature of the developer (solvent) and therefore influences the selection of the EBL parameters, such as dose (sensitivity). A molecular scale examination of the development process is necessary to elucidate the resist–developer interaction mechanisms. In this work, the authors investigate the interaction of short PMMA chains (containing up to 10 MMA units) with common developer components methyl isobutyl ketone (MIBK) and isopropyl alcohol (IPA). For this purpose, the authors conduct molecular dynamics simulations using the Accelrys Materials Studio package. The simulation results were used to characterize the mixtures in the spirit of the Flory–Huggins theory of polymers and also to extract the diffusivities. The authors found that the behavior of PMMA fragments differed consi...

ZEP brand electron beam resists are well-known for their high sensitivity and etch durability. The various performance metrics such as sensitivity, contrast, and resolution of ZEP resist depend strongly on the development process. In this work, we investigate the development of ZEP-520 resist through contrast curves, dense gratings, and surface roughness measurements using three different classes of developer systems of varying solvation strength, ZED-N50, methyl isobutyl ketone (MIBK) : isopropyl alcohol (IPA) 1:3, and IPA : H2O 7:3, at the ambient temperature (22 °C) and cold (-15 °C) development conditions. In order to provide a deeper insight into the ZEP development process, we propose a novel kinetic model of dissolution for ZEP, and develop an efficient analytical method that allows determining the microscopic parameters of ZEP dissolution based on experimental contrast curves. We also observe experimentally and characterize the negative tone behavior of ZEP for dense grating patterning and compare its performance with positive tone behavior.