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It can be seen from the figure that the characteristic decay times of microwave photoconductivity increase on going from CuGaSe SB 2 sb to AgGaSe SB 2 sb . High-purity Ag SB 1- I x i sb Cu SB I x i sb GaSe SB 2 sb powders ( I x i = 0, 0.30, 0.64, 1) were obtained by solid-phase synthesis from elemental Cu, Ag, Ga, and S (purity 4N) in evacuated quartz ampoules. The XRD study of these samples (PANalitical Aeris, Cu-K SB sb radiation) showed that they are monophasic CuGaSe SB 2 sb -AgGaSe SB 2 sb solid solutions. [Extracted from the article]

The loss kinetics of charge carriers generated by the emission pulses of nitrogen laser in II–VI semiconductor compounds, namely, n- and p-CdTe and CdS, is studied by the method of microwave photoconductivity. The decays of photoresponse after switching off the light consisted of fast (manifesting itself at times <30 ns) and slow (at times >50 ns) components. The shape of decay of a slow component was virtually independent of temperature, and at long times, the decay law corresponded to the linear dependence of the photoresponse on the logarithm of time. The assumption follows from the results that the slow component of the photoresponse decay reflects the loss process of charges captured in the traps due to the tunnel recombination. [ABSTRACT FROM AUTHOR]

The results of a microwave photoconductivity study on the effect of pretreatment of a silver chloride powder with sodium thiosulfate (STS) aqueous solutions on the kinetics of electron–ion processes in silver chloride are reported. At an UV light fluence of <1014 photon/cm–2 per pulse, photoresponse decay after the end of the pulse consisted of two exponential components over the entire concentration range 10–8–10–2 mol STS/mol AgCl examined. The amplitude of the components and the ratio between the slow τs and fast τf components depended on the sodium thiosulfate concentration, which was due to the formation of an additional number of “new” electron traps in AgCl. An analysis of the kinetics in terms of models taking into account various types of decay of an excess electron made it possible to obtain data on the depth of both “old” traps (0.45 eV) and new STS-created traps (0.45–0.63 eV) in AgCl. [ABSTRACT FROM AUTHOR]