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1. Enhanced electrical properties of atomic layer deposited La2O3 thin films with embedded ZrO2 nanocrystals.

Author

Jinesh, K. B., Klootwijk, J. H., Lamy, Y., Wolters, R., Tois, E., Tuominen, M., Roozeboom, F., and Besling, W. F. A.

Subjects
*LANTHANUM compounds, *ZIRCONIUM oxide, *NUCLEATION, *ELECTRIC fields, *DIELECTRIC films, *NANOCRYSTALS, *MATRIX effect
Abstract

The deposition of alternating (sub)monolayers of lanthanum oxide (La2O3) and zirconium oxide (ZrO2) by atomic layer deposition has been carried out to create uniform LayZr1-yOx mixed oxide films. However, spontaneous nucleation of ZrO2 nanocrystals occurs during deposition within an amorphous La2O3 matrix. Such ZrO2 embedded La2O3 films exhibit low leakage currents in combination with higher electric breakdown fields and higher dielectric permittivities than the pure lanthanum and zirconium oxide films. The possible scenarios that account for this enhanced electric performance of these nanocluster-embedded dielectric thin films are explained. [ABSTRACT FROM AUTHOR]

Published
2008
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