6 results on '"Haendler, S."'
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2. Characterization and modeling of low frequency noise in CMOS inverters
3. Low frequency noise variability in ultra scaled FD-SOI n-MOSFETs: Dependence on gate bias, frequency and temperature.
4. Improved analysis and modeling of low-frequency noise in nanoscale MOSFETs
5. Drain current local variability from linear to saturation region in 28 nm bulk NMOSFETs.
6. Full gate voltage range Lambert-function based methodology for FDSOI MOSFET parameter extraction.
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