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For large-area electronic applications, the mechanism of the leakage current in oxide-semiconductor thin-film transistors (TFTs) has become a critical issue. In this work, the impact of the irradiation location on the photo-leakage current of zinc oxide (ZnO) TFTs is investigated. The photo-leakage current of the ZnO TFTs is not only dependent on the light irradiation but it is also dependent on the parasitic capacitance between the drain electrode and the floating gate metal. The photo-leakage current of the source-half irradiation TFT is larger than that of the drain-half irradiation TFT. To explain this phenomenon, the profile of the electric potential and the electron concentration is analyzed by two-dimensional device simulation. It is found that the floating gate metal plays the dominant role in the photo-leakage current. This research provides insight into TFT structure optimization and high-performance TFT process development. [ABSTRACT FROM AUTHOR]

This paper presents a proposed capacitance readout circuit that enables a quadrupled (x4) output strength. A symmetric cross-coupling structure is proposed to amplify the voltage difference between two adjacent channels; hence, the detected signal can be integrated twice every clock cycle. Compared with conventional schematics, the proposed readout circuit shows an increased output strength for integration times within dozens of μs. In addition, the measurements show that the integrator resistors should be less than 1 kΩ to suppress the resistance–capacitance delay effects. Although the proposed capacitance readout circuit is implemented using discrete transistors, it has a good signal integrity at an operating clock cycle of 100 µs. Therefore, the proposed readout circuit is a promising way to detect small capacitance variations with short integration times. [ABSTRACT FROM AUTHOR]

A new pixel circuit is proposed for the realization of high resolution and high uniformity organic light-emitting diode on silicon (OLEDoS) microdisplays in this article. A compensation scheme is adopted to mitigate the influence of threshold voltage variation of the driving transistor on display uniformity. Furthermore, two coupling capacitors are used to reduce the voltage at the gate terminal of the driving transistor in order to extend the data voltage range. The performance of the proposed pixel circuit is verified in an industrial 0.18- $\mu \text{m}$ CMOS process. Simulation results show that the data voltage of the proposed pixel circuit ranges from 0.5 to 3.12 V, which is up to $4.37\times $ wider than the previously published pixel circuits. The emission current error of the proposed pixel circuit varies from −2.1% to 2.08%, under the condition of ±5 mV threshold voltage variation for the driving transistor. The maximum emission current error changes from −10.36% to −2.62% when the OLED turn-on voltage is increased by 5 to 20 mV due to device aging. Furthermore, the proposed pixel circuit only occupies a layout area of $8.1\,\,\mu \text{m}\,\,\times {4}\,\,\mu \text{m}$. [ABSTRACT FROM AUTHOR]

In this work we present a DC‐DC converter based on metal oxide thin film transistors (TFTs) for passive radio frequency identification (RFID) tags. To increase the voltage conversion ratio, the cross‐coupled structure with positive feedback from adjacent stages is proposed. Compared with conventional DC‐DC converter with separation block, the proposed circuit features the decreased threshold voltage drop, the reduced on‐resistance of switch transistor, the improved driving capability and the increased power efficiency. The simulated results reveal that the output voltage and maximum power efficiency for proposed two‐stage DC‐DC converter are 16.6 V and 52% at a output current of 550 µA, which are 12.6 V and 42% at a output current of 250 µA for conventional designs. [ABSTRACT FROM AUTHOR]

A novel bootstrap method is proposed, which can significantly reduce the clock feedthrough effect and the dynamic power consumption. An ESL a-IGZO TFTs based gate driver using this technique is designed. It is shown that the ripple voltage and the power consumption of the proposed driver are only 22.9% and 23.86% of those of the earlier driver. [ABSTRACT FROM AUTHOR]

This paper presents an IGZO-TFT latch circuit featuring high stability and simple structure with only 5 TFTs per stage. Pass-transistor logic style with gate voltage bootstrapped is used to suppress voltage amplitude loss and achieve a full swing output. Comparison studies are carried out with conventional latch, and results show that the proposed one has compact layout, free DC stress and enhanced immunity to △VTH. [ABSTRACT FROM AUTHOR]

Using low-temperature poly-silicon thin-film transistors (LTPS TFTs) as a basis, a pixel circuit for an active matrix organic light-emitting diode (AMOLED) with narrow bezel displays was developed. The pixel circuit features mono-type scanning signals, elimination of static power lines, and pixel-integrated emitting control functions. Therefore, gate driver circuits of the display bezel can be simplified efficiently. In addition, the pixel circuit has a high-resolution design due to an increase of the pulse width of the scan signal to extend the threshold voltage and internal–resistance drop (IR drop) detection period. Further, regarding the influences of process–voltage–temperature (PVT) variation in the pixel circuit, comparison investigations were carried out with the proposed circuit and other pixel circuits with mono-type scanning signals using Monte Carlo analysis. The feasibility of the proposed pixel circuit is well demonstrated, as the current variations can be reduced to 2.1% for the supplied power reduced from 5 V to 3 V due to IR drop, and the current variation is as low as 10.6% with operating temperatures from –40 degrees to 85 degrees. [ABSTRACT FROM AUTHOR]