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Insulated-gate bipolar transistor (IGBT) modules and dc-link capacitors are important parts in the majority of power electronic converters which contribute to cost, size, and failure rate on a considerable scale. This paper presents an online condition monitoring method for both IGBT modules and dc-link capacitors of power converters based on short-circuit current of an IGBT module, which is a good condition indicator according to the theory analysis. The failure prediction of dc-Link capacitor is realized by equivalent series resistance, which can be calculated by short-circuit current and a step voltage, and the bond wires fatigue can also be identified by the short-circuit current. The proposed method is capable for detecting small changes in the failure indicators of IGBT modules and electrolytic capacitors, and its effectiveness is validated by a confirmatory experiment. The novelty of the proposed method is that the degradations of IGBT modules and capacitors can be identified simultaneously, and has the merits of low cost and circuit simplicity [ABSTRACT FROM PUBLISHER]

Potential defects inside an insulated gate bipolar transistor (IGBT) module can be seen as precursors of being about to wear out, and are important for health monitoring of the IGBT module which is used to enhance reliability. A method for detecting defects in the IGBT module by identifying dynamic changes of the gate current is presented in this paper. It is based on the fact that parasitic elements inside the IGBT module are affected by local damage induced by aging over time, and subsequently, these influences are easily distinguished by dynamic changes of the gate current. The proposed prognostic approach is based on relevance vector machine framework, which can give accurate predictions and allow operators to observe unhealthy IGBT modules inside a power converter, and then take appropriate measures timely to avoid breakdown. The parasitic elements involved in the gate circuit are extracted, and their contributions to dynamic changes of the gate current are also discussed. Finally, a confirmatory experiment is carried out, and the correctness of the proposed method is verified. [ABSTRACT FROM AUTHOR]