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Experimental and theoretical investigations of photonic crystal (PhC) structures in silicon nitride/silicon dioxide (Si3N4/SiO2) vertical waveguiding geometry are reported. One-dimensional patterns, either periodic or with cavity layers, are carved onto the channel waveguides by using focused ion beam lithography. Broadband transmittance spectroscopy in the visible and near-infrared frequency ranges is employed to show photonic band gap behavior up to the fourth order. For structures with a cavity layer, resonant peaks appear in transmittance spectra within the photonic gaps, in agreement with theory. The results show the interest of Si3N4/SiO2-based PhC waveguides for photonics applications from the infrared up to the visible range. [ABSTRACT FROM AUTHOR]

We investigate the optical properties of planar waveguides where the core layer is formed by a silicon nanocrystals (Si-nc)/SiO2 superlattice. M-line measurements of the different waveguides yield the mode indices, which can be modeled by assuming anisotropic optical properties of the core layer. This anisotropy is related to the superlattice, i.e., it is a form birefringence. By modeling the m-line measurements with the structural data obtained by transmission electron microscopy analysis, we determine for each waveguide the value of the form birefringence, an upper limit of the nanocrystals size and their refractive index. Values of the form birefringence as high as 1% have been found. [ABSTRACT FROM AUTHOR]