1. A High Isolation Series-Shunt RF MEMS Switch
- Author
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Yuanwei Yu, Shi Xing Jia, Jian Zhu, and Yi Shi
- Subjects
Microelectromechanical systems ,Materials science ,series-shunt ,RF MEMS switch ,metal-contact ,electrical model ,business.industry ,Coplanar waveguide ,Electrical engineering ,lcsh:Chemical technology ,Biochemistry ,Atomic and Molecular Physics, and Optics ,Article ,Analytical Chemistry ,Switching time ,Insertion loss ,lcsh:TP1-1185 ,Radio frequency ,Electrical and Electronic Engineering ,business ,Instrumentation ,Ohmic contact ,Shunt (electrical) ,Voltage - Abstract
This paper presents a wide band compact high isolation microelectromechanical systems (MEMS) switch implemented on a coplanar waveguide (CPW) with three ohmic switch cells, which is based on the series-shunt switch design. The ohmic switch shows a low intrinsic loss of 0.1 dB and an isolation of 24.8 dB at 6 GHz. The measured average pull-in voltage is 28 V and switching time is 47 μs. In order to shorten design period of the high isolation switch, a structure-based small-signal model for the 3-port ohmic MEMS switch is developed and parameters are extracted from the measured results. Then a high isolation switch has been developed where each 3-port ohmic MEMS switch is closely located. The agreement of the measured and modeled radio frequency (RF) performance demonstrates the validity of the electrical equivalent model. Measurements of the series-shunt switch indicate an outstanding isolation of more than 40 dB and a low insertion loss of 0.35 dB from DC to 12 GHz with total chip size of 1 mm × 1.2 mm.
- Published
- 2009