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Ag sinter-joining technology has become one of the leading candidates to replace conventional high-Pb soldering technology for wide bandgap (WBG) power modules. In many cases of die-attach applications, Ni/Au plating is an inevitable choice for both die-back faces and substrates. In this study, a preheating treatment of the Ni/Au plating was utilized to increase the bond strength of the Ag sinter-joined structure of Cu-to-Cu to the electroless Ni/Au plating. Our research determined that the microstructure of the Ni/Au plating can be modified by performing an optimized preheating treatment. The thickness of the Ni underlayer was fixed at 5 μm, and the Au was plated with two different thicknesses of 0.1 μm and 0.3 μm. Ni/Au plated Cu substrates and Cu chips were preheated at various temperatures from 150°C to 350°C and then bonded with hybrid Ag particles at a low temperature of 250°C with a pressureless sintering process. Without the preheating treatment, average shear strength was 14.2 MPa (as plated Au), however, after a 1 h preheating treatment at 250°C, the interface microstructure change resulted in a 26.3 MPa shear strength, an increase of about 85%. The same improvement effect was also confirmed for the Au plating layer with a thickness of 0.3 μm. Energy dispersive x-ray spectrometry (EDS) and x-ray diffraction (XRD) analysis indicated that the preheating treatment influences the grain structure of the Au plating layer and removes defects, resulting in an increase of bond strength for the Au plated joint structure. [ABSTRACT FROM AUTHOR]

The thermal cycling life of direct bonded aluminum (DBA) and active metal brazing (AMB) substrates with two types of plating—Ni electroplating and Ni–P electroless plating—was evaluated by thermal shock tests between −50 and 250 °C. AMB substrates with Al2O3 and AlN fractured only after 10 cycles, but with Si3N4 ceramic, they retained good thermal stability even beyond 1000 cycles, regardless of the metallization type. The Ni layer on the surviving AMB substrates with Si3N4 was not damaged, while a crack occurred in the Ni–P layer. For DBA substrates, fracture did not occur up to 1000 cycles for all kind of ceramics. On the other hand, the Ni–P layer was roughened and cracked according to the severe deformation of the aluminum layer, while the Ni layer was not damaged after thermal shock tests. In addition, the deformation mechanism of an Al plate on a ceramic substrate was investigated both by microstructural observation and finite element method (FEM) simulation, which confirmed that grain boundary sliding was a key factor in the severe deformation of the Al layer that resulted in the cracking of the Ni–P layer. The fracture suppression in the Ni layer on DBA/AMB substrates can be attributed to its ductility and higher strength compared with those of Ni–P plating. [ABSTRACT FROM AUTHOR]