1. Donor implanted back-gates in GaAs for MBE-grown highest mobility two-dimensional electron systems.
- Author
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Scharnetzky, J, Baumann, P, Reichl, C, Karl, H, Dietsche, W, and Wegscheider, W
- Subjects
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ELECTRON mobility , *TWO-dimensional electron gas , *MOLECULAR beam epitaxy , *ELECTRON donors , *ELECTRON density , *GALLIUM arsenide - Abstract
Three different elements, silicon, selenium, and tellurium, are ion-implanted in gallium arsenide to form a conducting layer that serves as a back-gate to a molecular beam epitaxy overgrown two-dimensional electron gas. While the heavy ion tellurium creates too many defects in the gallium arsenide to form a conducting layer, both silicon and selenium show promising results combined with MBE-grown high-quality 2DEGs. Similar 2DEG mobilities compared to non-implanted reference samples are achieved for both silicon and selenium implanted structures. Individual contacts to the back-gate are challenging. However, silicon implanted structures, annealed before the MBE growth, result in a functional back-gate, and the electron density of the 2DEG can be tuned via the structured back-gate. [ABSTRACT FROM AUTHOR]
- Published
- 2021
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