1. Quantifying the data quality of focal series for inline electron holography
- Author
-
Alberto Eljarrat, Christoph Koch, and Michael R. S. Huang
- Subjects
010302 applied physics ,Materials science ,Series (mathematics) ,business.industry ,Phase (waves) ,Magnification ,02 engineering and technology ,021001 nanoscience & nanotechnology ,01 natural sciences ,Regularization (mathematics) ,Atomic and Molecular Physics, and Optics ,Electron holography ,Electronic, Optical and Magnetic Materials ,Amplitude ,Optics ,Transmission electron microscopy ,0103 physical sciences ,0210 nano-technology ,Phase retrieval ,business ,Instrumentation - Abstract
Inline electron holography, the recovery of amplitude and phase of an electron wave function having passed through a thin specimen from a focal series recorded in a transmission electron microscope is being applied in many labs worldwide. At medium range magnification (i.e. typically ≥ 0 . 8 nm where the lattice of small unit cell crystals such as silicon is not resolved), where the defocus needs to be varied over a rather large range of several hundred nm or even μ m, the retrieval of low spatial frequency information is severely affected by the choice of experimental parameters as well as the way of data normalization. Methods to quantitatively analyze the reliability of phase maps obtained by inline electron holography are presented, and data recorded and processed in different ways are compared. While, even under optimized conditions, the phase reconstructed from an experimental focal series still lacks very low spatial frequency components, regularization schemes exist and are demonstrated to effectively hide artifacts associated with this lack of information.
- Published
- 2020