1. Probabilistic design of integrated circuits with correlated input parameters
- Author
-
Abbas Seifi, Jiri Vlach, and Kumaraswamy Ponnambalam
- Subjects
Engineering ,Tolerance analysis ,business.industry ,Monte Carlo method ,Integrated circuit design ,Integrated circuit ,Switched capacitor ,Computer Graphics and Computer-Aided Design ,law.invention ,Application-specific integrated circuit ,Control theory ,law ,Filter (video) ,Electronic engineering ,Probabilistic design ,Electrical and Electronic Engineering ,business ,Software - Abstract
This paper presents an application of advanced first-order second-moment (AFOSM) reliability method to probabilistic design of integrated circuits with correlated parameters. The method avoids the transformation to the space of uncorrelated parameters and provides a conservative estimate of the yield. Optimal nominal values are found such that the cost of tolerances is minimized while the desired yield is achieved. Numerical results are presented for a switched capacitor filter and verified by Monte Carlo simulation.
- Published
- 1999