1. Probing defect emissions in bulk, micro- and nano-sized α-Al2O3 via X-ray excited optical luminescence.
- Author
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Wang, Zhiqiang, Li, Chunlei, Liu, Lijia, and Sham, Tsun-Kong
- Subjects
NANOPARTICLES ,LUMINESCENCE spectroscopy ,MOLECULAR probes ,ALUMINUM oxide ,OPTICAL properties of metals ,ELECTRONIC structure - Abstract
The electronic structure and optical properties of bulk, micro-sized, and nano-sized α-Al2O3 (wafer, microparticles (MPs), nanowires (NWs), and nanotubes (NTs)) have been investigated using X-ray absorption near-edge structures (XANES) and X-ray excited optical luminescence (XEOL). XANES results show that the wafer, MPs, and NTs have characteristic features of α-Al2O3. The NWs have a core/shell structure with a single crystalline α-Al2O3 core surrounded by an amorphous shell, which is consistent with transmission electron microscopy result. It is found that some Al3+ in the shell and core/shell interface of the NWs as well as the surface of the NTs were reduced to Al2+ or Al1+ during the growth process. XEOL results show that the wafer and MPs have a broad emission at 325 nm and a sharp emission at 694 nm, which are attributed to F+ center and Cr3+ impurities, respectively. The NWs exhibit an intense emission at 404 nm that comes from F center, while the NTs show relatively weak luminescence at 325, 433, and 694 nm, which are attributed to F+ center, F center, and Cr3+ impurities, respectively. The O K-edge XEOL confirms that the emissions of α-Al2O3 in the range of 250-550 nm are related to the oxygen site. Furthermore, on the basis of XEOL and photoluminescence yield, the strong luminescence of the NWs (404 nm) is related to the Al2+ or Al1+ in the shell and core/shell interface, while the luminescence of the NTs at 325 and 433 nm are related to the bulk and the Al2+ or Al1+ on the surface, respectively. [ABSTRACT FROM AUTHOR]
- Published
- 2013
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