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Field programmable gate arrays (FPGAs) have not only enhanced traditional sensing methods, such as pixel detection (CCD and CMOS), but also enabled the development of innovative approaches with significant potential for particle detection. This is particularly relevant in terahertz (THz) ray detection, where microbolometer-based focal plane arrays (FPAs) using microelectromechanical (MEMS) resonators are among the most promising solutions. Designing high-performance, high-pixel-density sensors is challenging without FPGAs, which are crucial for deterministic parallel processing, fast ADC/DAC control, and handling large data throughput. This paper presents a MEMS-resonator detector, fully managed via an FPGA, capable of controlling pixel excitation and tracking resonance-frequency shifts due to radiation using parallel digital lock-in amplifiers. The innovative FPGA architecture, based on a lock-in matrix, enhances the open-loop readout technique by a factor of 32. Measurements were performed on a frequency-multiplexed, 256-pixel sensor designed for imaging applications. [ABSTRACT FROM AUTHOR]

Atomic-scale imaging using scanning probe microscopy is a pivotal method for investigating the morphology and physico-chemical properties of nanostructured surfaces. Time resolution represents a significant limitation of this technique, as typical image acquisition times are on the order of several seconds or even a few minutes, while dynamic processes—such as surface restructuring or particle sintering, to be observed upon external stimuli such as changes in gas atmosphere or electrochemical potential—often occur within timescales shorter than a second. In this article, we present a fully redesigned field programmable gate array (FPGA)-based instrument that can be integrated into most commercially available standard scanning probe microscopes. This instrument not only significantly accelerates the acquisition of atomic-scale images by orders of magnitude but also enables the tracking of moving features such as adatoms, vacancies, or clusters across the surface ("atom tracking") due to the parallel execution of sophisticated control and acquisition algorithms and the fast exchange of data with an external processor. Each of these measurement modes requires a complex series of operations within the FPGA that are explained in detail. [ABSTRACT FROM AUTHOR]